SIMS depth profile analysis of WC-Co composite used in wood materials machining after nitrogen ion implantation

• Autorzy: Wilkowski J. , Barlak M. , Konarski P. , Böttger R. , Werner Z.
• Języki publikacji: EN

Abstrakty

EN

The paper presents the analysis of depth profiles WC-Co samples obtained using the SIMS method. The surface of samples was modified in the process of nitrogen ions implantation. Secondary ion mass spectrometry (SIMS) is a very useful technique for the analysis of layered systems. It is based on the primary ion beam sputtering of solids and mass analysis of the emitted secondary ions. The results show a high correspondence between the nitrogen depth profiles obtained in the SUSPRE modeling and in the SIMS experiment.

Słowa kluczowe

EN

secondary ion mass spectrometry; SIMS; depth profile analysis; WC-Co composites; machining; wood materials; nitrogen ion implantation

• Wydawca: Wydawnictwo Szkoły Głównej Gospodarstwa Wiejskiego w Warszawie
• Czasopismo: Annals of Warsaw University of Life Sciences - SGGW. Forestry and Wood Technology
• Rocznik: 2018
• Tom: No. 104
• Strony: 400--404
• Opis fizyczny: Bibliogr. 5 poz.

Twórcy

autor

Wilkowski J.

• Department of Mechanical Processing of Wood, Warsaw University of Life Sciences - SGGW

autor

Barlak M.

• Plasma and Ion Technology Division (FM2), National Centre for Nuclear Research Świerk - NCBJ

autor

Konarski P.

• Tele and Radio Research Institute – ITR

autor

Böttger R.

• Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf – HZDR

autor

Werner Z.

• Plasma and Ion Technology Division (FM2), National Centre for Nuclear Research Świerk - NCBJ

Bibliografia

• 1. BARLAK M., WILKOWSKI J., WERNER Z., 2016: Ion implantation changes of tribological and corrosion resistance properties of materials used in wood industry. Ann. WULS–SGGW, For and Wood Technol. 94: 19-27.
• 2. KONARSKI P., KACZOREK K., KALIŃSKI D., CHMIELEWSKI M., PIETRZAK K., BARLAK M., 2013: Ion implanted inconel alloy – SIMS and GDMS depth profile analysis. Surf. Interface Anal. 45: 494-497.
• 3. KONARSKI P., MIŚNIK M., ZAWADA A., BRONGERSMA H.H., 2014: Storing matter technique performed in the analytical chamber of a quadrupole SIMS analyser. Surf. Interface Anal. 46: 360-363.
• 4. MIŚNIK M., KONARSKI P., ZAWADA A., AŻGIN J., 2018: Application of ‘Storing Matter’ technique in SIMS depth profile analysis. Nuclear Inst. and Methods in Physics Research B: Article in press.
• 5. SOKOLOWSKA A., RUDNICKI J., BEER P., MALDZINSKI L., TACIKOWSKI J., BASZKIEWICZ J., 2001: Nitrogen transport mechanisms in low temperature ion nitriding. Surface and Coatings Technology 142-144: 1040-1045.

Uwagi

Opracowanie rekordu ze środków MEiN, umowa nr SONP/SP/546092/2022 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2022-2023).