The comparison of two supercapacitors lifetime estimated on the basis of accelerated degradation tests by means of stochastic models

• Autorzy: Kopka R. , Tarczyński W.

Identyfikatory

DOI

10.21008/j.1508-4248.2016.0007

• Języki publikacji: EN

Abstrakty

EN

The paper presents the results of the comparison of the lifetime estimation of two supercapacitors on the basis of the accelerated degradation tests by means of stochastic differential models. The acceleration of degradation processes was fulfilled by the increase of the operating voltage of the capacitors, while their reliability was assessed on the basis of the changes in equivalent series resistance. The reliability distribution function was determined using stochastic differential models. The model parameters were assessed based on the changes of supercapacitor parameter at the beginning of the testing process. In order to eliminate the effect of other factors accelerating the ageing process, supercapacitors were placed in a temperature chamber that provided a constant temperature during the tests. The paper describes the construction of the test setup, the tests procedure, and the method of reliability estimation. The use of two capacitors with different nominal voltages allowed for assessment of properties of particular parts of the test setup, as well as the proposed procedure for the tests and analysis of the results.

Słowa kluczowe

EN

supercapacitor; accelerated degradation tests; degradation processes; stochastic differential models; reliability

• Wydawca: Wydawnictwo Politechniki Poznańskiej
• Czasopismo: Computer Applications in Electrical Engineering
• Rocznik: 2016
• Tom: Vol. 14
• Strony: 77--88
• Opis fizyczny: Bibliogr. 11, rys., tab.

Twórcy

autor

Kopka R.

• Opole University of Technology

autor

Tarczyński W.

• Opole University of Technology

Bibliografia

• [1] Bae J.S., Kuo W., Kvam H.P., Degradation models and implied life time distributions, Reliability Engineering and System Safety, Vol. 92, pp. 601–608, 2007.
• [2] Escobar A.L., Meeker Q.W., A Review of Accelerated Test Models, Statistical Science 2006, Vol. 21, No. 4, pp. 552–577, 2006.
• [3] Kopka R., Tarczyński W., Measurement system for supercapacitors equivalent parameters determination, Metrology and Measurement Systems, Vol. XX, No. 4, pp. 581–590, 2013.
• [4] Kopka R., Estymacja parametrów niezawodnościowych półprzewodnikowych źródeł światła, Przegląd Elektrotechniczny, R. 85, Nr 11/2009, ss. 313–316, 2009.
• [5] Kopka R., Tarczyński W., Influence of the Operation Conditions on the Supercapacitors Reliability Parameters, Pomiary, Automatyka, Robotyka, R. 19, Nr 3/2015, pp. 49–54, 2015.
• [6] Meeker Q.W., Escobar A.L., Statistical Methods for Reliability Data, John Wiley & Sons, New York, 1998.
• [7] Pham H., Handbook of reliability engineering, Springer, London, 2003.
• [8] Pham H., Recent Advances in Reliability and Quality in Design, Springer, 2008.
• [9] Sobczyk K., Stochastic Differential Equations: With Applications to Physics and Engineering, Kluwer Academic Publishers B.V., Dordrecht, 1991.
• [10] Sun J.Q., Stochastic Dynamics and Control. Elsevier, Amsterdam, 2006.
• [11] Zili M., Filatova D.V., Stochastic Differential Equations and Processes, Springer, 2012.

Uwagi

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).