Diagnosis of Soft Spot Short Defects in Analog Circuits Considering the Thermal Behaviour of the Chip

• Autorzy: Tadeusiewicz M. , Hałgas S.

Identyfikatory

DOI

10.1515/mms-2016-0023

• Języki publikacji: EN

Abstrakty

EN

The paper deals with fault diagnosis of nonlinear analogue integrated circuits. Soft spot short defects are analysed taking into account variations of the circuit parameters due to physical imperfections as well as self-heating of the chip. A method enabling to detect, locate and estimate the value of a spot defect has been developed. For this purpose an appropriate objective function was minimized using an optimization procedure based on the Fibonacci method. The proposed approach exploits DC measurements in the test phase, performed at a limited number of accessible points. For illustration three numerical examples are given.

Słowa kluczowe

EN

analog circuits; fault diagnosis; short spot defects; thermal effects

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2016
• Tom: Vol. 23, nr 2
• Strony: 239--250
• Opis fizyczny: Bibliogr. 28 poz., rys., tab., wykr., wzory

Twórcy

autor

Tadeusiewicz M.

• Lodz University of Technology, Faculty of Electrical, Electronic, Computer and Control Engineering, Stefanowskiego 18/22, 90-924 Łódź, Poland

autor

Hałgas S.

• Lodz University of Technology, Faculty of Electrical, Electronic, Computer and Control Engineering, Stefanowskiego 18/22, 90-924 Łódź, Poland

Bibliografia

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Uwagi

EN

This work was supported by the Statutory Activities of Lodz University of Technology I12/1/DzS/2015.

PL

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę.