Test stand and procedures for estimating parameters of microbolometer detector

• Autorzy: Krupiński M. , Chmielewski K. , Bareła J. , Kastek M.
• Języki publikacji: EN

Abstrakty

EN

In this paper we present a test stand and a procedures to test the functionality of a microbolometer detector. Presented test stand is integrated with temperature driver to stabilize the temperature of a black body and the detector. Digital board with implemented application allows for capturing raw data, correcting non-uniformity, testing noise, sensitivity and NETD (noise equivalent temperature difference). Integration with temperature driver allows for more accurate and repeatable measurements.

Słowa kluczowe

EN

microbolometer parameters; non-uniformity correction

• Wydawca: Wydawnictwo PAK
• Czasopismo: Measurement Automation Monitoring
• Rocznik: 2017
• Tom: Vol. 63, No. 2
• Strony: 73--75
• Opis fizyczny: Bibliogr. 5 poz., rys., wykr., wzory

Twórcy

autor

Krupiński M.

• Military University of Technology, Institute of Optoelectronic, 2 Gen. S. Kaliskiego Str., 00-908 Warsaw

autor

Chmielewski K.

• Military University of Technology, Institute of Optoelectronic, 2 Gen. S. Kaliskiego Str., 00-908 Warsaw

autor

Bareła J.

• Military University of Technology, Institute of Optoelectronic, 2 Gen. S. Kaliskiego Str., 00-908 Warsaw

autor

Kastek M.

• Military University of Technology, Institute of Optoelectronic, 2 Gen. S. Kaliskiego Str., 00-908 Warsaw

Bibliografia

• [1] Kruse P. W.: Uncooled Thermal Imagining: Arrays, Systems, and Applications. The Society of Photo+Optical Instrumentation Engineers (2002).
• [2] Krupiński M., Bieszczad G., Gogler S., Madura H.: Non-uniformity correction with temperature influence compensation in microbolometer detector. Proc. SPIE 9481, Image Sensing Technologies: Materials, Devices, Systems, and Applications II, 948113 (May 13, 2015).
• [3] Milton A. F., Barone F. B., Kruer M. R.: Influence of nonuniformity on infrared focal plane array performance. Optical Engineering, Vol. 24, No. 5, pp. 855-862, (1985).
• [4] Wood R. A., Monolithic Silicon Microbolometer Arrays, Academic Press, (1997).
• [5] Tissot J. L., Tinnes S., Durand A., Minassian C., Robert P., Vilain M.: High performance Uncooled amorphous silicon VGA and XGA IRFPA with 17 μm pixel-pitch, Proc. SPIE 7834, Electro-Optical and Infrared Systems, (2010).

Uwagi

PL

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).