Near-field multiple optical trapping using high order axially symmetric polarized beams

• Autorzy: Zhou Z , Tan Q , Zhu L , Yang C
• Języki publikacji: EN

Abstrakty

EN

The near-field multiple optical trapping using high order axially symmetric polarized beams (ASPBs) is studied for the first time. First, a near-field optical trapping scheme is proposed based on the Kretschmann–Raether configuration, and surface plasmon polaritons (SPPs) field distributions excited by incident ASPBs are calculated, which present a multi-focal-spot pattern and the size of spots is much smaller than that of the diffraction limitation. Then, the gradient forces on Rayleigh dielectric particles formed by the multi-focal-spot focused field are computed, which indicates that multiple ultra-small particles with the refractive index higher than that of the ambient medium can be trapped simultaneously on the metal surface. The number and size of trapped particles can be manipulated by flexibly modifying the polarization order of incident beams, which is expected to enhance the capability of traditional optical trapping systems and provide a solution for massively parallel optical trapping of nanometer-sized particles.

Słowa kluczowe

EN

optical trapping; surface plasmon polaritons; axially symmetric polarized beams

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2013
• Tom: Vol. 43, nr 2
• Strony: s. 287--296
• Opis fizyczny: Bibliogr. 32 poz., rys., wykr.

Twórcy

autor

Zhou Z

• Beijing Engineering Research Center of Optoelectronic Information and Instruments, Beijing Information Science and Technology University, Beijing 100192, China
• State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing 100084, China

autor

Tan Q

• State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing 100084, China

autor

Zhu L

• Beijing Engineering Research Center of Optoelectronic Information and Instruments, Beijing Information Science and Technology University, Beijing 100192, China

autor

Yang C

• State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing 100084, China

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