Spectral resolution of Cauchois-Johansson spectrometer

• Autorzy: Baronova E. O. , Stepanenko M. M.
• Konferencja: International Workshop on Dense Magnetised Plasmas IWDMP’2000 (12-14.10.2000 ; Kudowa Zdrój, Poland)
• Języki publikacji: EN

Abstrakty

EN

Spectral resolution of a Cauchois-Johansson spectrometer is analyzed analytically and studied experimentally, using an X-ray tube. Widening of Mo K-alpha spectra, taken in the transmission regime are discussed. Spectral resolution is shown to be δλ/λ ≈ 1.7×10–3. This value is explained by the influence of crystal thickness and diffraction defocusing of line.

Słowa kluczowe

EN

resolution; spectrograph; X-rays

• Wydawca: Institute of Nuclear Chemistry and Technology
• Czasopismo: Nukleonika
• Rocznik: 2001
• Tom: Vol. 46, suppl. 1
• Strony: 53--56
• Opis fizyczny: Bibliogr. 4 poz., rys.

Twórcy

autor

Baronova E. O.

• Russian Research Center “Kurchatov Institute”, Kurchatov sq. 1, 123182 Moscow, Russia, Tel.: [phone], Fax: [phone]

autor

Stepanenko M. M.

• Russian Research Center “Kurchatov Institute”, Kurchatov sq. 1, 123182 Moscow, Russia, Tel.: [phone], Fax: [phone]

Bibliografia

• 1. Babichev AP, Babushkina NA, Bratkovski AM et al. (1991) Physical values. Energoatomizdat, Moscow
• 2. Baronova EO, Stepanenko MM, Pereira NR (2001) Cauchois-Johansson X-ray spectrograph for 1.5–400 keV energy range. Rev Sci Instrum (in press)
• 3. Baronova EO, Stepanenko MM, Lider VV, Pereira NR (1998) Characterization of reflection properties of Johansson spherical crystals on optical contact and Cauchois-Johansson crystals. In: Proc Workshop on Curved Crystals. Weimar, Germany: 964
• 4. Korn G, Korn T (1968) Mathematical handbook. Science, Moscow