Comparison of thermal impedance and wavelets analysis for non-destructive testing

• Autorzy: Kopeć M. , Kałuża M. , Więcek B.
• Języki publikacji: EN

Abstrakty

EN

This paper presents a comparison of two methods used for non-destructive testing: thermal impedance (Zth) and wavelet transform (WT). The transient heating process of a textolite plate with defects was measured using a thermographic camera. Based on the measurement results, a qualitative and quantitative assessment of material structure was performed. The measured parameters describing the geometry of the tested material were temperature, time constant, angular frequency and phase. The presented results of thermographic measurements and their analysis indicate the possibility of detection of subsurface defects using both presented methods. The convergence and the correlation between results obtained using thermal impedance and wavelet methods are presented.

Słowa kluczowe

EN

nondestructive testing; thermography; T3Ster analysis; wavelet analysis

• Wydawca: Wydawnictwo PAK
• Czasopismo: Measurement Automation Monitoring
• Rocznik: 2015
• Tom: Vol. 61, No. 6
• Strony: 223--227
• Opis fizyczny: Bibliogr. 17 poz., rys., tab., wykr.

Twórcy

autor

Kopeć M.

• Lodz University of Technology, Inst. of Electronics, 90-924 Łódź, Wólczańska 211/215 St.

autor

Kałuża M.

• Lodz University of Technology, Inst. of Electronics, 90-924 Łódź, Wólczańska 211/215 St.

autor

Więcek B.

• Lodz University of Technology, Inst. of Electronics, 90-924 Łódź, Wólczańska 211/215 St.

Bibliografia

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