On asymptotic approach to reliability improvement of multi-state systems with components quantitative and qualitative redundancy : „m out of n” systems

• Autorzy: Kwiatuszewska-Sarnecka B.
• Języki publikacji: EN

Abstrakty

EN

The paper is composed of two parts, in this part the multi-state homogeneous „m out of n” systems with reserve components are defined and their multi-state limit reliability functions are determined. In order to improve of the reliability of these systems the following methods are used: (i) a warm duplication of components, (ii) a cold duplication of components, (iii) a mixed duplication of components, (iv) improving the reliability of components by reducing their failure rate. Next, the effects of the systems’ reliability different improvements are compared.

Słowa kluczowe

EN

reliability improvement; limit reliability function

• Wydawca: Polskie Towarzystwo Bezpieczeństwa i Niezawodności
• Czasopismo: Journal of Polish Safety and Reliability Association
• Rocznik: 2007
• Tom: Vol. 2
• Strony: 265--277
• Opis fizyczny: Bibliogr. 6 poz., rys.

Twórcy

autor

Kwiatuszewska-Sarnecka B.

• Gdynia Maritime University, Poland

Bibliografia

• [1] Barlow, R. E. & Proschan, F. (1975). Statistical Theory of Reliability and Life Testing. Probability Models. Holt Rinehart and Winston, Inc., New York.
• [2] Kołowrocki, K. (2004). Reliability of Large Systems. Elsevier.
• [3] Kwiatuszewska-Sarnecka, B. (2002). Analyse of Reserve Efficiency in Series Systems. PhD thesis, Gdynia Maritime University, (in Polish).
• [4] Kolowrocki, K., Kwiatuszewska-Sarnecka, B. at al. (2003). Asymptotic Approach to Reliability Analysis and Optimisation of Complex Transportation Systems. Part 2, Project founded by Polish Committee for Scientific Research, Gdynia: Matitime University, (in Polish).
• [5] Kwiatuszewska-Sarnecka, B. (2006). Reliability improvement of large multi-state series-parallel systems. International Journal of Automation and Computing 2, 157-164.
• [6] Xue, J. (1985). On multi-state system analysis, IEEE Transactions on Reliability, 34, 329-337.