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Warianty tytułu
Języki publikacji
Abstrakty
This study focuses on the description of oxidation of CdTe monocrystal surfaces after selective chemical etching. Measurements of surface morphology of the oxides occurring in short time are valuable for deeper understanding of the material degradation and fabrication of reliable devices with enhanced performance. The samples with (1 1 1) orientation were selectively etched and cleaned of oxide. Exposure of the oxide-free surfaces of CdTe to air at normal atmospheric conditions over 24 hours leads to an appearance of characteristic surface features. The oxidized surfaces were investigated by scanning electron microscopy, scanning probe microscopy, Raman spectroscopy and ellipsometry. The results indicate clear differences in the oxidation of Cd-terminated and Te-terminated surfaces.
Słowa kluczowe
Wydawca
Czasopismo
Rocznik
Tom
Strony
206--211
Opis fizyczny
Bibliogr. 23 poz., rys.
Twórcy
autor
- Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Technická 8, 616 00 Brno, Czech Republic
- Central European Institute of Technology BUT, Purkynova 123, 612 00 Brno, Czech Republic
autor
- Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Technická 8, 616 00 Brno, Czech Republic
autor
- Central European Institute of Technology BUT, Purkynova 123, 612 00 Brno, Czech Republic
autor
- Department of Condensed Matter Physics, Faculty of Science, Masaryk University, Kotlarska 2, 611 37 Brno, Czech Republic
autor
- Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Technická 8, 616 00 Brno, Czech Republic
- Central European Institute of Technology BUT, Purkynova 123, 612 00 Brno, Czech Republic
autor
- South Dakota School of Mines, EP220, Electrical Engineering and Physics, 501 East St. Joseph Street Rapid City, 57701 South Dakota, USA
Bibliografia
- [1] Ogawa K., Muraishi M., IEEE T. Nucl. Sci., 57 (2010), 17.
- [2] Dallaeva D., Ramazanov SH., Prokopzeva E., Tomanek P., Grmela L., Proc. SPIE 9442, (2015), UNSP 944208.
- [3] Skarvada P., Macku R., Dallaeva D., Sedlak P., Grmela L., Tomanek P., Proc. SPIE, 9450 (2015), 94501M.
- [4] Ramazanov SH., Talu S., Sobola D., Stach S., Ramazanov G., Superlattice. Microst., 86 (2015), 395.
- [5] Ţălu Ş., Papež N., Sobola D., Achour A., Solaymani S., J. Mater. Sci. Mater. El., 15 (2017), 15370.
- [6] Amézaga A., Holmström E., Lizárraga R., Menéndez-Proupin E., Bartolo-Pérez P., Giannozzi P., Phys. Rev. B, 81 (2010).
- [7] Zázvorka J., Franc J., Statelov M., Pekárek J., Veis M., Moravec P., Mašek K., Surf. Sci., 389 (2016), 1214.
- [8] Korovyanko O.O., Shcherbak L.P., Nakonechnyi I.Y., Zakharuk Z.I., Fochuk P.M., Bolotnikov A.E., James R.B., J. Cryst. Growth, 475 (2017), 26.
- [9] Cohen-Taguri G., Levinshtein M., Ruzin A., Goldfarb I., Surf. Sci., 602 (2008), 712.
- [10] Sobola D., Talu S., Sadovsky P., Papez N., Grmela L., Adv. Electr. Electron. Eng., 15 (2017).
- [11] Knápek A., Sobola D., Tománek P., Pokorná Z., Urbánek M., Appl. Surf. Sci., 395 (2017), 157.
- [12] Papez N., Škvarenina L., Tofel P., Sobola D., Proc. SPIE, (2017).
- [13] Knápek A., Sýkora J., Chlumská J., Sobola D., Microelectron. Eng., 173 (2017).
- [14] Dallaeva D., Talu S., Stach S., Skarvada P., Tomanek P., Grmela L., Appl. Surf. Sci., (2014) 81.
- [15] Stach S., Dallaeva D., Talu S., Kaspar P., Tomanek P., Giovanzana S., Grmela L., Mater. Sci.-Poland, 33 (2015), 175.
- [16] Hawkins S. A., Villa-Aleman E., Duff M.C., Hunter D.B., Burger A., Groza M., Buliga V., Black D.R., J. Electron. Mater., 37 (2008), 1438.
- [17] Zázvorka J., Franc J., Beran L., Moravec P., Pekárek J., Veis M., Sci. Technol. Adv. Mater., 17 (2016), 792.
- [18] George M.A., Collins W.E., Chen K.T., Hu Z., Egarievwe S.U., Zheng Y., Burger A., J. Appl. Phys., 77 (1995), 3134.
- [19] Talu S., Stępień K., Caglayan M. O., Microsc. Res. Tech., 78 (2015), 1026.
- [20] Méndez A., Reyes Y., Trejo G., Stępień K., Ţălu Ş., Microsc. Res. Tech., 78 (2015), 1082.
- [21] Sobola D., Talu S., Solaymani S., Grmela L., Microsc. Res. Tech., 80 (2017), 1328.
- [22] Garczyk Z., Stach S., Talu S., Sobola D., Wrobel Z., JBBBE, 31 (2017), 1.
- [23] Knapek A., Sykora J., Chlumska J., Sobola D., Microelectron. Eng. 173 (2017), 42.
Uwagi
PL
Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2019).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-097a3ae7-d8f9-4faa-b622-1b49d92f4af7