Lighting setting features of opto-electronic measuring system for controlling adhesive joints optical components

• Autorzy: Markina O. N.

Identyfikatory

DOI

10.5604/01.3001.0010.7781

• Języki publikacji: EN

Abstrakty

EN

Purpose: The purpose of this article is to study the features of setting and selecting the source of illumination of the optoelectronic measuring system for the control of adhesive joints of optical parts. Design/methodology/approach: The research and analysis of the lighting characteristics of halogen and LED lamps, used as a source of illumination in the measuring system, was carried out. Findings: In the course of experimental studies, the sensitivity and resolution of fixing defects of adhesive joints of optical parts were increased and the measurement error was reduced from 10 ± 1.2 microns to 10 ± 0.3 microns. Research limitations/implications: The limitations of the accuracy of the measurement are 10 ± 0.3 microns of adhesive defects, since the studies were conducted on separate samples of glues that did not cover all adhesives for the connection of optical surfaces and the thickness of glass surfaces was 1 mm and 2 mm. Practical implications: With the application of the lighting system approach described in the article, it is possible to improve any optoelectronic measuring system, thereby increasing the accuracy of the measurement. Originality/value: The originality of the results of the article is the experimental data of the studies of light-technical characteristics of the halogen lamp, which is used in the optoelectronic measuring system.

Słowa kluczowe

EN

optoelectronic measuring system; geometrical sizes of defects in adhesive bonds; CMOS matrix

PL

optoelektroniczny system pomiarowy; matryca CMOS

• Wydawca: International OCSCO World Press
• Czasopismo: Journal of Achievements in Materials and Manufacturing Engineering
• Rocznik: 2017
• Tom: Vol. 84, nr 2
• Strony: 49--57
• Opis fizyczny: Bibliogr. 15 poz., rys., tab.

Twórcy

autor

Markina O. N.

• National Technical University of Ukraine «Igor Sikorsky Kyiv Polytechnic Institute», 37, Prosp. Peremohy, 03056, Kyiv, Ukraine

Bibliografia

• [1] O.M. Markina, Development of the method for television control of transparent in the optical range materials, Proceedings of the Quality, Standardization, Control: Theory and Practice: XIV International Scientific Practice Conference, 2014, Odessa, 88-89 (in Ukrainian).
• [2] Patent No. 95934, Ukraine. IPC (2006.01) G01N 25/72. Method of controlling optically transparent materials / O.M. Markina, N.V. Kachur, No. u 2014 08494, Filed 07/25/2014; has published Jan. 12, 2015, Bul. No. 1 (in Ukrainian).
• [3] O.M. Markina, Evaluation of accuracy of the geometrical parameters by means of television informative-measuring systems (M.O. Markin, O.M. Markina) Bulletin of NTUU “KPI” Series: Instrument Marking 38 (2009) 102-106.
• [4] O.M. Markina, Definition of geometrical dimensions of microobjects using tv measurement systems (M.O. Markin, O.M. Markina, U.A. Agninskiy), Bulletin of NTUU “KPI” Series instrument marking 46 (2013) 64-70.
• [5] The Nobel Prize in Chemistry 2014, Surpassing the limitations of the light microscopy, Available from: https://nobelprize.org/nobel_prizes/chemistry/laureates/2014press.html.
• [6] The Nobel Prize in Chemistry 1982, Available from: https://nobelprize.org/nobel_prizes/chemistry/laureates/1982/.
• [7] The development of the electron microscope and of electron microscopy, Available from: https://nobelprize.org/nobel_prizes/physics/laureates/1986/ruska-lecture.pdf.
• [8] Handbook of the chemist. Non-destructive testing of glue connections, Available from: http://chem21.info/info/785845/.
• [9] O.M. Markina, M.O. Markin, M.V. Filippova, D. Harasim, K. Mussabekov, A. Annabayev, The peculiarity of the construction of an optical-electronic system for measurement of geometrical parameters of objects in the micrometer range, Proceedings of SPIE 10445: Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments 104456B (2017) doi: 10.1117/12.2280987.http://dx.doi.org/10.1117/12.2280987.
• [10] O.M. Markina, V. Maslov, Ways of improvement of digital measuring systems on the basis of optical microscope Biolam L211, Monograph, K.: Igor Sikorsky KPI, 2017,125.
• [11] L. Tian, L. Wallter, 3D intensity and phase imaging from light field measurements in an LED array microscope, Optica 2/2 (2015) 104-111.
• [12] L.A. Mikheenko, V.N. Borovitsky, Secondary standards of brightness on the basis of a halogen lamp with a diffuser, Metrology and Standardization Technology and Design in Electronic Equipment 3 (2008) 61-64.
• [13] O.M. Markina, Research of JC halogen lamps features of use in television measuring, Assembling in Mechanical Engineering, Instrument-making 5/178 (2015) 6-8.
• [14] Backlighting Surfaces Using LEDs, Available from: http://www.oksolar.com/led/led_color_chart.htm.
• [15] LED professional Trends and Technologies for Future Lighting Solutions, Available from: https://www.led-professional.com/technology/optics/microstructured-optics-for-led-applications.

Uwagi

PL

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).