Effect of linewidth enhancement factor (LEF) on routes to chaos in optically injected semiconductor lasers

• Autorzy: Al-Hosiny N. M.

Identyfikatory

DOI

10.37190/oa210412

• Języki publikacji: EN

Abstrakty

EN

The effect of the linewidth enhancement factor (LEF) or α-factor on two common routes to chaos (mainly period-doubling and quasi-periodic routes) in optically injected semiconductor laser is theoretically investigated using bifurcation diagrams. The value of the LEF is slightly modified to examine the sensitivity of routes to chaos to any variation in the LEF. Despite the fact that LEF enhances chaos in the system, both routes are found to be highly insensitive to the variation in the LEF.

Słowa kluczowe

EN

injection locking; chaos; linewidth enhancement factor; routes to chaos

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2021
• Tom: Vol. 51, nr 4
• Strony: 621--632
• Opis fizyczny: Bibliogr. 31 poz., rys., tab.

Twórcy

autor

Al-Hosiny N. M.

• Department of Physics, College of Science, Taif University, P.O. Box 11099, Taif 21944, Saudi Arabia

Bibliografia

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