Enhanced visibility of graphene: the effect of the Brewster angle

• Autorzy: Adamson P.

Identyfikatory

DOI

10.5277/oa170303

• Języki publikacji: EN

Abstrakty

EN

Visibility and simple optical diagnostics possibilities of graphene layers on dielectric and semiconductor substrates at the Brewster angle are analyzed. The analysis is based on a numerical simulation. Several oxide semiconductors (ITO, ZnO, TiO2), weakly absorbing Si, and strongly absorbing GaAs are considered. It is shown that at the Brewster angle the optical contrast of graphene flakes on a bare semiconductor substrate is actually strong enough to see them under an optical microscope and there is really no need to create an additional interference film on the substrate.

Słowa kluczowe

EN

optical characterization; two-dimensional material; graphene; Brewster angle; differential reflectance

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2017
• Tom: Vol. 47, nr 3
• Strony: 363--372
• Opis fizyczny: Bibliogr. 23 poz., rys.

Twórcy

autor

Adamson P.

• Institute of Physics, University of Tartu, Riia 142, Tartu 51014, Estonia

Bibliografia

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