Optical Filters’ Influence on Digital Image Quality in High Temperature Measurements of Surface Properties

• Autorzy: Fabijanska A , Sankowski D.
• Języki publikacji: EN

Abstrakty

EN

This paper is concerned with high temperature image quantitative analysis systems. Particular attention is paid to computerised system for surface properties (wetting angle and surface tension) determination. A brief description of the system is given. The specificity of the performed measurements based on images presenting heat-emitting objects is considered. Moreover, the significance of optical filters’ usage is explained. Infrared and neutral density filters are regarded. Influence of these filters on digital image quality is deliberated. Especially image noise presence is considered. The detailed analysis of noise properties change due filters usage is carried out. Finally, results of the analysis are presented and discussed.

Słowa kluczowe

EN

digital image processing; image quality; optical filters; image quantitative analysis; image noise

• Wydawca: Społeczna Akademia Nauk w Łodzi
• Czasopismo: Journal of Applied Computer Science Methods
• Rocznik: 2009
• Tom: Vol. 1 No. 2
• Strony: 53--63
• Opis fizyczny: Bibliogr. 7 poz., rys., tab.

Twórcy

autor

Fabijanska A

• Computer Engineering Department, The Technical University of Lodz, Łódź, Poland

autor

Sankowski D.

• Computer Engineering Department, The Technical University of Lodz, Łódź, Poland

Bibliografia

• 1. Gonzalez R.C., Woods R. E., 2002, Digital Image Processing (2nd Edition), Prentice Hall, New Jersey.
• 2. http://www.optical-filters.com/ng4.html.
• 3. http://www.optical-filters.com/bg38.html
• 4. Kurz L., Benteftifa M. H., 1997, Analysis of Variance in Statistical Image Processing, Cambridge University Press, Cambridge.
• 5. Madisetti V., Williams D. B., 1998, The digital signal processing handbook, CRC Press, USA.
• 6. Sankowski D., Senkara J., Strzecha K., Jeżewski S, 2001, Automatic investigation of surface phenomena in high temperature solid and liquid contacts, Proceedings of IEEE Instrumentation and Measurement Technology Conference IMTC, Budapest, Hungary, pp. 1397-1400.
• 7. Sankowski D., Senkara J., Strzecha K., 2003, Computerized system for assessment of quality of solders, IEEE The Experience of Designing and Application of CAD Systems in Microelectronics, Proceedings of the VIIth International Conference CADSM, Lviv- Slavske, Ukraine, pp. 56-58.