Tytuł artykułu
Treść / Zawartość
Pełne teksty:
Identyfikatory
Warianty tytułu
Języki publikacji
Abstrakty
Semiconductor low-dimensional structures of CdTe quantum dots (QDs) embedded in ZnTe matrix have been investigated by micro-Raman spectroscopy. A reference ZnTe sample (without dots) was also studied for comparison. Both samples were grown by a molecular beam epitaxy technique on the p-type GaAs substrate. The Raman measurements have been performed at room temperature. The samples were excited by an Ar2+ laser of 514.5 nm wavelength. The Raman spectra have been recorded for different acquisition parameters of the measurement. For the reference and QD sample localized longitudinal (LO) phonons of 210 cm–1 wavenumber associated with the ZnTe layer are observed. In the case of QD sample another broadband corresponding to the LO CdTe phonon related to the QD-layer appears at a wavenumber of 160 cm–1. Such behaviour does not exhibit the Raman spectra of the reference sample. Thus the Raman measurements confirm the presence of CdTe layer of quantum dots in the investigated material. Additionally, Raman spectra for both samples exhibit tellurium-related peaks at wavenumbers around 120 cm–1 and 140 cm–1, significantly increasing with laser time exposure. It is shown that the peaks are associated with the formation of Te aggregates on the ZnTe surface due to the laser damage in the ZnTe layer.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Strony
181--185
Opis fizyczny
Bibliogr. 11 poz., rys., wykr.
Twórcy
autor
- Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
autor
- Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
autor
- Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
autor
- Institute of Physics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
autor
- Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland
Bibliografia
- [1] BELLAKHDER H., OUTZOURHIT A., AMEZIANE E.L., Study of ZnTe thin films deposited by r.f. sputtering, Thin Solid Films 382(1–2), 2001, pp. 30–33.
- [2] MACKOWSKI S., KARCZEWSKI G., WOJTOWICZ T., KOSSUT J., KRET S., SZCZEPANSKA A., DLUZEWSKI P., PRECHTL G., HEISS W., Structural and optical evidence of island correlation in CdTe/ZnTe superlattices, Applied Physics Letters 78(24), 2001, pp. 3884–3886.
- [3] SCHLESINGER T.E., TONEY J.E., YOON H., LEE E.Y., BURNETT B.A., FRANKS L., JAMES R.B., Cadmium zinc telluride and its use as a nuclear radiation detector material, Materials Science and Engineering R: Reports 32(4–5), 2001, pp. 103–189.
- [4] DUFF M.C., HUNTER D.B., BURGER A., GROZA M., BULIGA V., BLACK D.R., Effect of surface preparation technique on the radiation detector performance of CdZnTe, Applied Surface Science 254(9), 2008, pp. 2889–2892.
- [5] TAO WANG, WANQI JIE, DONGMEI ZENG, Observation of nano-scale Te precipitates in cadmium zinc telluride with HRTEM, Materials Science and Engineering: A 472(1–2), 2008, pp. 227–230.
- [6] SOARES M.L., LOPES J.C., CARMO M.C., NEVES A., Micro-Raman study of laser damage in CdTe, Physica Status Solidi (C) 1(2), 2004, pp. 278–280.
- [7] LARRAMENDI E.M., BERTH G., WIEDEMEIER V., HUSH K.-P., ZRENNER A., WOGGON U., TSCHUMAK E., LISCHKA K., SCHIKORA D., Intensity enhancement of Te Raman modes by laser damage in ZnTe epilayers, Semiconductor Science and Technology 25(7), 2010, article 075003.
- [8] WOJNAR P., SUFFCZYNSKI J., KOWALIK K., GOLNIK A., ALESZKIEWICZ M., KARCZEWSKI G., KOSSUT J., Size-dependent magneto-optical effects in CdMnTe diluted magnetic quantum dots, Nanotechnology 19(23), 2008, article 235403.
- [9] VINOGRADOV V.S., KARCZEWSKI G., KUCHERENKO I.V., MEL’NIK N.N., FERNANDEZ P., Raman spectra of structures with CdTe-, ZnTe-, and CdSe-based quantum dots and their relation to the fabrication technology, Physics of the Solid State 50(1), 2008, pp. 164–167.
- [10] TEAGUE L.C., HAWKINS S.A., DUFF M.C., GROZA M., BULIGA V., BURGER A., AFM characterization of Raman laser-induced damage on CdZnTe crystal surfaces, Journal of Electronic Materials 38(8), 2009, pp. 1522–1527.
- [11] KOHZO SATO, SADAO ADACHI, Optical properties of ZnTe, Journal of Applied Physics 73(2), 1993, pp. 926–931.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-04aaedd3-916d-49c4-b638-9008df6c3790