Polarization dependent high refractive index metamaterial with metallic dielectric grating structure in infrared band

• Autorzy: Li Jianmin , Chen Peng , Fang Bo , Cai Jinhui , Zhang Le , Wu Yinglai , Jing Xufeng

Identyfikatory

DOI

10.37190/oa220310

• Języki publikacji: EN

Abstrakty

EN

According to the theory of high refractive index of metamaterials, a composite structure of metal dielectric grating was designed to achieve high refractive index in infrared band. Based on the S-parameter inversion algorithm, we extracted the effective permittivity, the effective permeability, and the effective refractive index of the designed metamaterial. By changing the geometric parameters of the composite grating metamaterial structure, the effective refractive index of the designed metamaterial reaches more than 8.0 at the infrared resonance frequency. This is a high refractive index that many natural materials cannot achieve. It is noteworthy that the metamaterial structure has obvious polarization sensitivity. The metamaterial structure has both high refractive index and wideband zero refractive index properties when different polarized light is incident. At the same time, we further investigate the influence of metamaterial geometric parameters on the effective refractive index of metamaterials. Also, we propose a double grating metamaterial structure to obtain more degrees of freedom of metamaterial on the effective refractive index.

Słowa kluczowe

EN

metamaterial; high refractive index; infrared band

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2022
• Tom: Vol. 52, nr 3
• Strony: 441--460
• Opis fizyczny: Bibliogr. 50 poz., rys.

Twórcy

autor

Li Jianmin

• University of Shanghai for Science and Technology, No.516 JungGong Road, Shanghai 200093, China

autor

Chen Peng

• College of Metrology & Measurement Engineering, China Jiliang University, Hangzhou 310018, China

autor

Fang Bo

• College of Metrology & Measurement Engineering, China Jiliang University, Hangzhou 310018, China

autor

Cai Jinhui

• College of Metrology & Measurement Engineering, China Jiliang University, Hangzhou 310018, China

autor

Zhang Le

• College of Metrology & Measurement Engineering, China Jiliang University, Hangzhou 310018, China

autor

Wu Yinglai

• School of Entrepreneurship, Hangzhou Dianzi University, Hangzhou 310000, China

autor

Jing Xufeng

• Institute of Optoelectronic Technology, China Jiliang University, Hangzhou 310018, China
• Centre for THz Research, China Jiliang University, Hangzhou 310018, China

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