Five-wavelength laser microrefractometer

• Autorzy: Bodurov I , Yovcheva T , Sainov S

Identyfikatory

DOI

10.5277/oa150206

• Języki publikacji: EN

Abstrakty

EN

Corresponding author: In this paper, the design and testing of a five-wavelength laser microrefractometer are presented. Five semiconductor lasers are used for the spectral region of 405–1320 nm. The presented device is based on the critical angle method. In this case, the critical angle of total internal reflection is determined with the help of a CCD camera detecting the disappearance of the diffraction pattern, created by a metal diffraction grating. The samples of a thin liquid layer (< 10 μm) are placed between a flint-glass prism and a chromium diffraction grating. The refractive indices of two matching liquid products of Cargille Laboratories are investigated for the approbation of the presented device. The measured values of the refractive indices are used for the dispersion curves construction. The obtained values of the refractive indices are compared with the catalog data given by the manufacturer.

Słowa kluczowe

EN

refractometer; semiconductor lasers; dispersion; refractive index; diffraction

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2015
• Tom: Vol. 45, nr 2
• Strony: 199--204
• Opis fizyczny: Bibliogr. 9 poz., rys., tab.

Twórcy

autor

Bodurov I

• Department of Experimental Physics, Plovdiv University “Paisii Hilendarski”, 24 Tsar Asen St., 4000 Plovdiv, Bulgaria

autor

Yovcheva T

• Department of Experimental Physics, Plovdiv University “Paisii Hilendarski”, 24 Tsar Asen St., 4000 Plovdiv, Bulgaria

autor

Sainov S

• “HOLOBUL” Ltd., Acad. Georgi Bonchev St., block 4, 1113 Sofia, Bulgaria

Bibliografia

• [1] SAINOV S., DUSHKINA N., Simple laser microrefractometer, Applied Optics 29(10), 1990, pp. 1406–1408.
• [2] SAINOV S., Differential laser microrefractometer, Applied Optics 31(31), 1992, pp. 6589–6591.
• [3] SAINOV S., SAROV Y., KURTEV S., Wide-spectral-range laser refractometer, Applied Optics 42(13), 2003, pp. 2327–2328.
• [4] SAROV Y., SAINOV S., KOSTIC I., SAROVA V., MITKOV S., Automatic VIS-near IR laser refractometer, Review of Scientific Instruments 75(10), 2004, pp. 3342–3344.
• [5] VLAEVA I., YOVCHEVA T., ZDRAVKOV K., MINCHEV G., STOYKOVA E., Design and testing of fourwavelength laser micro-refractometer, Proceedings of SPIE 7027, 2008, article 70270S.
• [6] http://www.cargille.com/immeroil.shtml
• [7] http://www.cargille.com/immerliq.shtml
• [8] TAN W.C., KOUGHIA K., SINGH J., KASAP S.O., Fundamental optical properties of materials, [In] Optical Properties of Condensed Matter and Applications, [Ed.] Jai Singh, Wiley, New York, 2006, pp. 7–9.
• [9] BODUROV I., YOVCHEVA T., SAINOV S., Refractive index investigations of nanoparticles dispersed in water, Journal of Physics: Conference Series 558, 2014, article 012062.