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2013 | 11 | 2 | 239-244
Tytuł artykułu

Influence of terbium on structure and luminescence of nanocrystalline TiO2 thin films

Treść / Zawartość
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
In this work analysis of the structural and optical properties of TiO2 thin films doped with terbium has been described. Samples were prepared by a high energy reactive magnetron sputtering process under low pressure of oxygen plasma. X-ray diffraction results have shown that different TiO2 crystal forms have been produced, depending on the amount of Tb dopant. The undoped matrix had rutile structure with crystallites with a size of 8.7 nm, while incorporation of 0.4 at. % of Tb into the film during the sputtering process resulted in anatase structure with bigger crystallites (11.7 nm). Increasing the amount of terbium up to 2 at. % and 2.6 at. % gave rutile structure with crystallites with a size of 6.6 nm for both films. However, Raman spectroscopy has revealed that in the case of TiO2:(2 at. % Tb), except for the rutile form, the presence of fine-crystalline anatase was observed. Moreover, the lack of Raman peaks shift attests to the lack of stress in the titania lattice of all of the TiO2:Tb films. This fact indicates localization of Tb3+ ions on the surface of TiO2 nanocrystals. In the case of optical investigation, results have shown that doping with terbium has a significant influence on the properties of TiO2, but it does not decrease the high transparency of the matrix. The observed changes of the transmission characteristics were produced only due to modification of the TiO2:Tb structure. Photoluminescence measurements have shown that emission of light from TiO2:Tb films occurs when the amount of terbium is 2.6 at. %. Based on the obtained results a scheme of direct energy transfer from titanium dioxide matrix (with rutile structure) to Tb3+ ions has been proposed.
Słowa kluczowe
Wydawca

Czasopismo
Rocznik
Tom
11
Numer
2
Strony
239-244
Opis fizyczny
Daty
wydano
2013-02-01
online
2013-02-09
Twórcy
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego 11/17, 50-370, Wroclaw, Poland, damian.wojcieszak@pwr.wroc.pl
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego 11/17, 50-370, Wroclaw, Poland
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego 11/17, 50-370, Wroclaw, Poland
  • Institute of Low Temperature and Structure Research, Polish Academy of Science, Okolna 2, 50-422, Wroclaw, Poland
  • Institute of Low Temperature and Structure Research, Polish Academy of Science, Okolna 2, 50-422, Wroclaw, Poland
Bibliografia
  • [1] K. L. Frindell et al., J. Solid State Chem. 172, 81 (2003) http://dx.doi.org/10.1016/S0022-4596(02)00126-3[Crossref]
  • [2] M. R. Hoffmann, S. T. Martin, W. Choi, D. W. Bahnemann, Chem. Rev. 95, 69 (1995) http://dx.doi.org/10.1021/cr00033a004[Crossref]
  • [3] C. Y. Li, Q. Su, J. Qiu, Chin. J. Lumin. 24, 19 (2003)
  • [4] P. M. Kumar, S. Badrinarayanan, M. Sastry, Thin Solid Films 358, 122 (2000) http://dx.doi.org/10.1016/S0040-6090(99)00722-1[Crossref]
  • [5] M. Saquib, M. Muneer, Dyes Pigments 53, 237 (2002) http://dx.doi.org/10.1016/S0143-7208(02)00024-4[Crossref]
  • [6] B. K. Moon et al., J. Lumin. 122, 873 (2007) http://dx.doi.org/10.1016/j.jlumin.2006.01.313[Crossref]
  • [7] M. Zalewska, A. M. KŁonkowski, Opt. Mater. 30, 725 (2008) http://dx.doi.org/10.1016/j.optmat.2007.02.021[Crossref]
  • [8] Y. Xie et al., Appl. Phys. Let. 97, 141916 (2010) http://dx.doi.org/10.1063/1.3496471[Crossref]
  • [9] T. Hikita, T. Sado, K. Kawano, J. Alloy. Compd. 408, 886 (2006) http://dx.doi.org/10.1016/j.jallcom.2005.01.100[Crossref]
  • [10] Z. Yuan et al., J. Alloy. Compd. 474, 246 (2009) http://dx.doi.org/10.1016/j.jallcom.2008.06.054[Crossref]
  • [11] Y. Sheng et al., Thin Solid Films 519, 7966 (2011) http://dx.doi.org/10.1016/j.tsf.2011.05.009[Crossref]
  • [12] C. Jia et al., Thin Solid Films 496, 555 (2006) http://dx.doi.org/10.1016/j.tsf.2005.08.378[Crossref]
  • [13] E. Comini et al., Sensor. Actuat. B-Chem. 108, 21 (2005) http://dx.doi.org/10.1016/j.snb.2004.10.041[Crossref]
  • [14] H. Choi, J. H. Kim, S. Yi, B. K. Moon, J. H. Jeong, J. Alloy. Compd. 408, 816 (2006) http://dx.doi.org/10.1016/j.jallcom.2005.01.067[Crossref]
  • [15] B. K. Moon et al., Opt. Mater. 28, 676 (2006) http://dx.doi.org/10.1016/j.optmat.2005.09.042[Crossref]
  • [16] A. Conde-Gallardo, M. Garcia-Rocha, R. Palomino- Merino, M. P. Velasquez-Queasda, I. Hernandez-Calderon, Appl. Surf. Sci. 212, 583 (2003) http://dx.doi.org/10.1016/S0169-4332(03)00131-4[Crossref]
  • [17] D. Kaczmarek et al., Opt. Appl. 37, 433 (2007)
  • [18] D. Kaczmarek et al., Mater. Sci.-Poland 26, 113 (2008)
  • [19] Powder Diffraction File, Joint Committee on Powder Diffraction Standards, Philadelphia, PA, Card 21-1276 (1967)
  • [20] Powder Diffraction File, Joint Committee on Powder Diffraction Standards, Philadelphia, PA, Card 21-1272 (1967)
  • [21] H. L. Ma et al., Appl. Surf. Sci. 253, 7497 (2007) http://dx.doi.org/10.1016/j.apsusc.2007.03.047[Crossref]
  • [22] G. Bertoni et al., Ultramicroscopy 106, 630 (2006) http://dx.doi.org/10.1016/j.ultramic.2006.03.006[Crossref]
  • [23] J. Domaradzki et al., Vacuum 82, 1007 (2008) http://dx.doi.org/10.1016/j.vacuum.2008.01.021[Crossref]
  • [24] J. Domaradzki, D. Wojcieszak, E. Prociow, D. Kaczmarek, Acta Phys. Pol. A 116, 75 (2009)
  • [25] E. Prociow, J. Domaradzki, D. Kaczmarek, T. Berlicki, Polish patent No PL 211827 B1, 2012
  • [26] J. Domaradzki, D. Kaczmarek, E. Prociow, Polish patent No PL 210206 B1, 2011
  • [27] D. De Graaf, S. J. Stelwagen, H. T. Hintzen, G. de With, J. Non-Cryst. Solids 325, 29 (2003) http://dx.doi.org/10.1016/S0022-3093(03)00324-7[Crossref]
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_s11534-012-0151-7
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