PL EN


Preferencje help
Widoczny [Schowaj] Abstrakt
Liczba wyników
Czasopismo
2011 | 9 | 6 | 1421-1425
Tytuł artykułu

Characterization of the surface topography and nano-hardness of Cu/Ni multilayer structures

Treść / Zawartość
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
This article describes the results of a study of Cu/Ni multilayer coatings applied on a monocrystalline Si(100) silicon substrate by the deposition magnetron sputtering technique. Composed of 100 bilayers each, the multilayers were differentiated by the Ni sublayer thickness (1.2 to 3 nm), while maintaining the constant Cu sublayer thickness (2 nm). The multilayer coatings were characterized by assessing their surface topography using atomic force microscopy and their mechanical properties with nano-hardness measurements by the Berkovich method. The tests showed that the hardness of multilayers was substantially influenced by the thickness ratio of Cu and Ni sublayers and by surface roughness. The highest hardness and, at the same time, the lowest roughness was exhibited by a multilayer structure with a Cu-to-Ni sublayer thickness ratio of 2:1.5.
Wydawca

Czasopismo
Rocznik
Tom
9
Numer
6
Strony
1421-1425
Opis fizyczny
Daty
wydano
2011-12-01
online
2011-10-15
Twórcy
autor
  • Institute of Materials Engineering, Czestochowa University of Technology, al. Armii Krajowej 19, 42-200, Czestochowa, Poland, kulej@wip.pcz.pl
  • Institute of Materials Engineering, Czestochowa University of Technology, al. Armii Krajowej 19, 42-200, Czestochowa, Poland
  • Department of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, B-3001, Heverlee, Belgium
  • Institute of Materials Engineering, Czestochowa University of Technology, al. Armii Krajowej 19, 42-200, Czestochowa, Poland
Bibliografia
  • [1] N. T. Loux, N. Savage, Water Air Soil. Poll. 194, 227 (2008) http://dx.doi.org/10.1007/s11270-008-9712-1[Crossref]
  • [2] C. A. Huang, C. Y. Chen, C. C. Hsu, C. S. Lin, Scripta Mater. 57, 61 (2007) http://dx.doi.org/10.1016/j.scriptamat.2007.02.004[Crossref]
  • [3] D. Cheng, Z. Y. Yan, L. Yan, Thin Solid Films 515, 3698 (2007) http://dx.doi.org/10.1016/j.tsf.2006.10.001[Crossref]
  • [4] L. L. Hinchey, D. L. Mills, Phys. Rev. B 33, 3329 (1986) http://dx.doi.org/10.1103/PhysRevB.33.3329[Crossref]
  • [5] K. Sakaue, N. Sano, H. Terauchi, A. Yoshihara, J. Cryst. Growth 150, 1154 (1995) http://dx.doi.org/10.1016/0022-0248(95)80120-2[Crossref]
  • [6] M. N. Baibich, J. M. Broto, A. Fert, F. N. Van Dau, F. Petroff, P. Etienne, G. Creuzet, A. Friederich, J. Chazelas, Phys. Rev. Lett. 61, 2472 (1988) http://dx.doi.org/10.1103/PhysRevLett.61.2472[Crossref]
  • [7] G. H. Yang, B. Zhao, Y. Gao, F. Pan, Surf. Coat. Tech. 191, 127 (2005) http://dx.doi.org/10.1016/j.surfcoat.2004.02.006[Crossref]
  • [8] H. C. Barsilia, K. S. Rajam, Surf. Coat. Tech. 155, 195 (2002) http://dx.doi.org/10.1016/S0257-8972(02)00008-7[Crossref]
  • [9] B. Kucharska, E. Kulej, J. Kanak, Sol. St. Phen. Vol. 163, 291 (2010) http://dx.doi.org/10.4028/www.scientific.net/SSP.163.291[Crossref]
  • [10] T. Stobiecki, M. Kopcewicz, F. J. Castaño, Solitons and Fractals 10, 2031 (1999) http://dx.doi.org/10.1016/S0960-0779(98)00252-5[Crossref]
  • [11] A. Tokarz, A. Wolkenberg, A. Bochenek, Z. Nitkiewicz, A. Łaszcz, H. Wrzesinska, T. Przesławski, Composites 1, 2 (2001) (in Polish)
  • [12] X. Y. Zhu, X. J. Liu, R. L. Zong, F. Zeng, F. Pan, Mater. Sci. Eng. A 527, 1243 (2010) http://dx.doi.org/10.1016/j.msea.2009.09.058[Crossref]
  • [13] B. Kucharska, E. Kulej, M. Witkowska, Z. Nitkiewicz, Inzynieria Materiałowa 175, 439 (2010)
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_s11534-011-0055-y
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.