Czasopismo
Tytuł artykułu
Warianty tytułu
Języki publikacji
Abstrakty
In this paper we presented a new method (Eigen-Coordinates (ECs)) that can be used for calculations of the critical points (CPs) energy of the interband-transition edges of the heterostructures. This new method is more accurate and complete in comparison with conventional ones and has a wide range of application for the calculation of the fitting parameters related to nontrivial functions that initially have nonlinear fitting parameters that are difficult to evaluate. The new method was applied to determine the CPs energies from the dielectric functions of the MBE grown GaAs1−xPx ternary alloys obtained using spectroscopic ellipsometry (SE) measurements at room temperature in the 0.5-5 eV photon energy region. The obtained results are in good agreement with the results of the other methods.
Czasopismo
Rocznik
Tom
Numer
Strony
729-739
Opis fizyczny
Daty
wydano
2011-06-01
online
2011-02-26
Twórcy
autor
- Faculty of Physics, Magurele-Bucharest, Romania and National Mihail Sadoveanu High School, District 2, University of Bucharest, Bucharest, Romania
autor
- Theoretical Physics Department, Kazan State University, Kazan, 420008, Tataristan, Russia
autor
- Faculty of Art and Sciences, Department of Physics, Gazi University, Teknikokullar, Ankara, 06500, Turkey
autor
- Faculty of Art and Sciences, Department of Mathematics and Computer Sciences, Çankaya University, Ankara, 06530, Turkey, dumitru@cankaya.edu.tr
autor
- Faculty of Art and Sciences, Department of Physics, Gazi University, Teknikokullar, Ankara, 06500, Turkey, sozcelik@gazi.edu.tr
Bibliografia
- [1] S.S. Cetin, T.S. Mammadov, S. Ozcelik, Optoelectron. Adv. Mat. 3, 910 (2009)
- [2] K.J. Kim, M.H. Lee, J.H. Bahng, K. Shim, B.D. Choe, J. Appl. Phys. 84, 3696 (1998) http://dx.doi.org/10.1063/1.368546[Crossref]
- [3] N.B. Sedrine, J. Rihani, J.L. Stehle, J.C. Harmand, R. Chtourou, Mater. Sci. Eng. C 28, 640 (2008) http://dx.doi.org/10.1016/j.msec.2007.10.008[Crossref]
- [4] T.H. Ghong, T.J. Kim, Y.W. Jung, Y.D. Kim, D.E. Aspnes, J. Appl. Phys. 103, 073502 (2008) http://dx.doi.org/10.1063/1.2902502[Crossref]
- [5] S.S. Cetin et al., Surf. Interface Anal. 42, 1252 (2010) http://dx.doi.org/10.1002/sia.3265[Crossref]
- [6] A.B. Djurisic, Y. Chan, E. Helbert, Mater. Sci. Eng. R38, 237 (2002)
- [7] J.J. Yoon et al., Appl. Surf. Sci. 256, 1031 (2009) http://dx.doi.org/10.1016/j.apsusc.2009.01.088[Crossref]
- [8] R.R. Nigmatullin, Appl. Magn. Reson. 14, 601 (1998) http://dx.doi.org/10.1007/BF03161865[Crossref]
- [9] R.R. Nigmatullin, Physica A 285, 547 (2000) http://dx.doi.org/10.1016/S0378-4371(00)00237-5[Crossref]
- [10] M.M. Abdul-Gader Jafar, R.R. Nigmatullin, Thin Solid Films 396, 280 (2001) http://dx.doi.org/10.1016/S0040-6090(01)01166-X[Crossref]
- [11] R.R. Nigmatullin, M.M. Abdul-Gader Jafar, N. Shinyashiki, S. Sudo, S. Yagihara, J. Non-Cryst. Solids 305, 96 (2002) http://dx.doi.org/10.1016/S0022-3093(02)01125-0[Crossref]
- [12] R.R. Nigmatullin, S.I. Osokin, G. Smith, J. Phys.-Condens. Mat. 15, 3481 (2003) http://dx.doi.org/10.1088/0953-8984/15/20/309[Crossref]
- [13] R.R. Nigmatullin, S.I. Osokin, G. Smith, J. Phys. D Appl. Phys. 36, 2281 (2003) http://dx.doi.org/10.1088/0022-3727/36/18/018[Crossref]
- [14] R.R. Nigmatullin, Physica B 358, 201 (2005) http://dx.doi.org/10.1016/j.physb.2005.01.173[Crossref]
- [15] R.R. Nigmatullin, A.L. Mehaute, J. Non-Cryst. Solids 351, 2888 (2005) http://dx.doi.org/10.1016/j.jnoncrysol.2005.05.035[Crossref]
- [16] R.R. Nigmatullin, Physica A 363, 282 (2006) http://dx.doi.org/10.1016/j.physa.2005.08.033[Crossref]
- [17] R.R. Nigmatullin, S.O. Nelson, Signal Process. 86, 2744 (2006) http://dx.doi.org/10.1016/j.sigpro.2006.02.018[Crossref]
- [18] R.R. Nigmatullin, S.O. Nelson, IEEE T. Dielect. El. In. 13, 1325 (2006) http://dx.doi.org/10.1109/TDEI.2006.258204[Crossref]
- [19] R.R. Nigmatullin et al., Physica B 388, 418 (2007) http://dx.doi.org/10.1016/j.physb.2006.06.153[Crossref]
- [20] R.R. Nigmatullin, A.A. Arbuzov, F. Salehli, A. Gis, H. Catalgil-Giz, J. Non-Cryst. Solids 353, 4143 (2007) http://dx.doi.org/10.1016/j.jnoncrysol.2007.06.043[Crossref]
- [21] R.R. Nigmatullin, Physica B 404, 255 (2009) http://dx.doi.org/10.1016/j.physb.2008.10.047[Crossref]
- [22] R.R. Nigmatullin, Commun. Nonlinear Sci. 15, 637 (2010) http://dx.doi.org/10.1016/j.cnsns.2009.05.019[Crossref]
- [23] M. Al-Hasan, R.R. Nigmatullin, Renew. Energ. 28, 93 (2003) http://dx.doi.org/10.1016/S0960-1481(01)00151-3[Crossref]
- [24] R.R. Nigmatullin, G. Smith, Physica A 320, 291 (2003) http://dx.doi.org/10.1016/S0378-4371(02)01600-X[Crossref]
- [25] R.R. Nigmatullin, Phys. Wave Phenom. 16, 119 (2008) http://dx.doi.org/10.3103/S1541308X08020064[Crossref]
- [26] V.V. Afanasiev, R.R. Nigmatullin, Y.E. Polsky, Tech. Phys. Lett.+ 30, 675 (2004) http://dx.doi.org/10.1134/1.1792310[Crossref]
- [27] H. Fujiwara, Spectroscopic Ellipsometry Principles and Applications (John Wiley & Sons, New York, 2007)
- [28] S. Adachi, Phys. Rev. B 38, 12345 (1988) http://dx.doi.org/10.1103/PhysRevB.38.12345[Crossref]
- [29] M. Bugajski, A.M. Kontkiewicz, H. Mariette, Phys. Rev. B 28, 7105 (1983) http://dx.doi.org/10.1103/PhysRevB.28.7105[Crossref]
- [30] C.S. Cook et al., Thin Solid Films 455, 217 (2004) http://dx.doi.org/10.1016/j.tsf.2003.11.277[Crossref]
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_s11534-010-0068-y