Trap-assisted tunnelling current in MIM structures

• Autorzy: Juraj Racko , Miroslav Mikolášek , Ralf Granzner , Juraj Breza , Daniel Donoval , Alena Grmanová , Ladislav Harmatha , Frank Schwierz , Karol Fröhlich
• Języki publikacji: EN

Abstrakty

EN

A new model is presented of current transport in Metal Insulator Metal (MIM) structures by quantum mechanical tunnelling. In addition to direct tunnelling through an insulating layer, tunnelling via defects present in the insulating layer plays an important role. Examples of the influence of the material and thickness of the insulating layer, energy distribution of traps, and metal work functions are also provided.

Słowa kluczowe

EN

MIM; I-V characteristics; trap-assisted tunnelling; high-permittivity dielectrics

• Czasopismo: Open Physics
• Rocznik: 2011
• Tom: 9
• Numer: 1
• Strony: 230-241

Daty

wydano

2011-02-01

online

2010-09-24

Twórcy

autor

Juraj Racko

• Slovak University of Technology, Ilkovičova 3, 812 19, Bratislava, Slovakia,

autor

Miroslav Mikolášek

• Slovak University of Technology, Ilkovičova 3, 812 19, Bratislava, Slovakia

autor

Ralf Granzner

• Technical University of Ilmenau, PF 98684, Ilmenau, Germany

autor

Juraj Breza

• Slovak University of Technology, Ilkovičova 3, 812 19, Bratislava, Slovakia

autor

Daniel Donoval

• Slovak University of Technology, Ilkovičova 3, 812 19, Bratislava, Slovakia

autor

Alena Grmanová

• Slovak University of Technology, Ilkovičova 3, 812 19, Bratislava, Slovakia

autor

Ladislav Harmatha

• Slovak University of Technology, Ilkovičova 3, 812 19, Bratislava, Slovakia

autor

Frank Schwierz

• Technical University of Ilmenau, PF 98684, Ilmenau, Germany

autor

Karol Fröhlich

• Slovak Academy of Sciences, Dúbravská cesta 9, 841 04, Bratislava, Slovakia

Bibliografia

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Identyfikatory

DOI

10.2478/s11534-010-0027-7