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2008 | 6 | 2 | 332-343
Tytuł artykułu

Determination of thin film refractive index and thickness by means of film phase thickness

Treść / Zawartość
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
A new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.
Słowa kluczowe
Wydawca

Czasopismo
Rocznik
Tom
6
Numer
2
Strony
332-343
Opis fizyczny
Daty
wydano
2008-06-01
online
2008-03-26
Twórcy
autor
  • Physics Department, University of Rousse, 7017, Rousse, Bulgaria
Bibliografia
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Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_s11534-008-0035-z
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