PL EN


Preferencje help
Widoczny [Schowaj] Abstrakt
Liczba wyników
Czasopismo
2008 | 6 | 1 | 52-56
Tytuł artykułu

Concentration of radiation displacement defects in BSO and BGO crystals irradiated by electrons or neutrons

Autorzy
Treść / Zawartość
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
This work is devoted to the calculation of the concentration of radiation displacement defects (RDD) in bismuth germanate and bismuth silicate crystals as a function of particle energy (electrons and neutrons). Energy dependencies of RDD concentrations are discussed in comparison with results for other complex oxide crystals. The obtained results show that for the case of electron irradiation the radiation hardness of BSO and BGO should be similar to other oxide crystals, but for neutrons is drastically smaller. Additionally, for the neutron irradiation, the efficiency of the production of defects in the oxide sublattice is drastically smaller than for other oxide crystals.
Wydawca

Czasopismo
Rocznik
Tom
6
Numer
1
Strony
52-56
Opis fizyczny
Daty
wydano
2008-03-01
online
2008-03-26
Twórcy
autor
Bibliografia
  • [1] S.B. Ubizskii, et al., Phys. Stat. Sol. (a) 177, 349 (2000) http://dx.doi.org/10.1002/(SICI)1521-396X(200002)177:2<349::AID-PSSA349>3.0.CO;2-B[Crossref]
  • [2] T. Yano, K. Ichikawa, M. Akiyoshi, Y. Tachi, J. Nucl. Mater. 283–287, 947 (2000) http://dx.doi.org/10.1016/S0022-3115(00)00092-1[Crossref]
  • [3] P. Kurczynski, et al., Nucl. Instrum. Meth. A 431, 141 (1999) http://dx.doi.org/10.1016/S0168-9002(99)00283-1[Crossref]
  • [4] F. Albernhe, et al., Nucl. Instrum. Meth. A 492, 91 (2002) http://dx.doi.org/10.1016/S0168-9002(02)01289-5[Crossref]
  • [5] R. Zhu, H. Stone, H. Newman, T. Zhou, H. Tan, C. He, Nucl. Instrum. Meth. A 302, 69 (1991) http://dx.doi.org/10.1016/0168-9002(91)90493-A[Crossref]
  • [6] K. Harada, M. Ishii, N. Senguttuvan, M. Kobayashi, M. Nikl, X. Feng, Jpn. J. Appl. Phys. 40, 1360 (2001) http://dx.doi.org/10.1143/JJAP.40.1360[Crossref]
  • [7] X. Li, X. Fang, Shanghai Daxue Xuebao, Zitan Kexueban 8, 535 (2002)
  • [8] E. Friedland, Critical Reviews in Solid State and Material Sciences 25, 87 (2001) http://dx.doi.org/10.1080/20014091104170[Crossref]
  • [9] G.H. Kinchin, R.S. Pease, Rep. Progr. Phys. 18, 1 (1955) http://dx.doi.org/10.1088/0034-4885/18/1/301[Crossref]
  • [10] P. Potera, Comp. Meth. Sci. Technol. 13, 47 (2007)
  • [11] W.A. McKinley, H. Feshbach, Phys. Rev. 74, 1759 (1948) http://dx.doi.org/10.1103/PhysRev.74.1759[Crossref]
  • [12] S.B. Ubizskii, The bulletin of State University “Lvivska Polytechnica” 357, 88 (1998)
  • [13] S. Utsunomiya, S. Yudintsev, L.M. Wang, R.C. Ewing, J. Nucl. Mater. 322, 180 (2003) http://dx.doi.org/10.1016/S0022-3115(03)00327-1[Crossref]
  • [14] W.J. Weber, F. Gao, R. Devanathan, W. Jiang, Nucl. Instrum. Meth. B 218, 68 (2004) http://dx.doi.org/10.1016/j.nimb.2003.12.006[Crossref]
  • [15] S. Utsunomiy, L.M. Wang, R.C. Ewing, Nucl. Instrum. Meth. B 191, 600 (2002) http://dx.doi.org/10.1016/S0168-583X(02)00618-3[Crossref]
  • [16] G.C. Messenger, M.S. Ash, The Effects of Radiation on Electronic Systems, 2nd edition (Van Nostrand Reinhold, New York, 1992)
  • [17] E.R. Hodgson, L. Arizmendi, F. Agullo-Lopez, Nucl. Instrum. Meth. B 65, 275 (1992) http://dx.doi.org/10.1016/0168-583X(92)95048-V[Crossref]
  • [18] E.R. Hodgson, F. Agullo-Lopez, Solid State Commun. 64, 965 (1987) http://dx.doi.org/10.1016/0038-1098(87)90572-2[Crossref]
  • [19] A. Matkovskii, D. Sugak, S. Melnyk, P. Potera, A. Suchocki, Z. Frukacz, J. Alloys Comp. 300–301, 395 (2000) http://dx.doi.org/10.1016/S0925-8388(99)00771-9[Crossref]
  • [20] V. Vasyltiv, et al., Phys. Stat. Sol. (a) 140, 353 (1993) http://dx.doi.org/10.1002/pssa.2211400206[Crossref]
  • [21] E. Hodgson, C. Zaldo, F. Agullo-Lopez, Solid State Commun. 75, 351 (1990) http://dx.doi.org/10.1016/0038-1098(90)90910-4[Crossref]
  • [22] J. Crawford, Nucl. Instrum. Meth. B 1, 159 (1984) http://dx.doi.org/10.1016/0168-583X(84)90063-6[Crossref]
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_s11534-008-0002-8
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.