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2007 | 5 | 3 | 428-445
Tytuł artykułu

On formation of thin SiO2/a-Si:H interface when biased oxidized semiconductor surface interacts with plasma or liquid solution

Treść / Zawartość
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
In this paper we present the results of research into a relation(s) between the bias voltage of an oxide/a-Si:H/c-Si sample during formation of very-thin and thin oxides and the resulting distribution of oxide/semiconductor interface states in the a-Si:H band gap. Two oxygen plasma sources were used for the first time in our laboratories for formation of oxide layers on a-Si:H: i) inductively coupled plasma in connection with its application at plasma anodic oxidation; ii) rf plasma as the source of positive oxygen ions for the plasma immersion ion implantation process. The oxide growth on a-Si:H during plasma anodization is also simply described theoretically. Properties of plasmatic structures are compared to ones treated by chemical oxidation that uses 68 wt% nitric acid aqueous solutions. We have confirmed that three parameters of the oxide growth process - kinetic energy of interacting particles, UV-VIS-NIR light emitted by plasma sources, and bias of the samples - determine the distribution of defect states at both the oxide/a-Si:H interface and the volume of the a-Si:H layer, respectively. Additionally, a bias of the sample applied during the oxide growth process has a similar impact on the distribution of defect states as it can be observed during the bias-annealing of similar MOS structure outside of the plasma reactor.
Wydawca
Czasopismo
Rocznik
Tom
5
Numer
3
Strony
428-445
Opis fizyczny
Daty
wydano
2007-09-01
online
2007-05-01
Twórcy
  • Institute of Physics SAS, Dúbravská cesta 9, 845 11, Bratislava, Slovak Republic
  • Institute of Scientific and Industrial Research, Osaka University, and CREST, Japan Science and Technology Organization, 8-1 Mihogaoka, Ibaraki, Osaka, 567-0047, Japan
  • Institute of Scientific and Industrial Research, Osaka University, and CREST, Japan Science and Technology Organization, 8-1 Mihogaoka, Ibaraki, Osaka, 567-0047, Japan
  • Department of Engineering Fundamentals, Faculty of Electrical Engineering, University of Žilina, 031 01, Liptovský Mikuláš, Slovak Republic
  • Institute of Physics SAS, Dúbravská cesta 9, 845 11, Bratislava, Slovak Republic
Bibliografia
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Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_s11534-007-0019-4
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