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2007 | 5 | 2 | 188-200
Tytuł artykułu

Evaluation of the inelastic mean free path (IMFP) of electrons in polyaniline and polyacetylene samples obtained from elastic peak electron spectroscopy (EPES)

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Języki publikacji
EN
Abstrakty
EN
The inelastic mean free path (IMFP) of electrons was determined experimentally for selected polyaniline and polyacetylene samples with Ag and Ni references using elastic peak electron spectroscopy (EPES). The surface composition was determined by XPS and density by helium pycnometry. The high resolution hemispherical ESA-31 and ADES-400 spectrometers were used for measurements in the energy range E = 0.5–3.0 keV and E =0.4 − 1.6 keV, respectively. The integrated elastic peak intensity ratios for sample and reference were calculated using the Monte Carlo (MC) algorithm based on the electron elastic scattering cross-sections database NIST SRD64 version 3.1 and applying TPP-2M IMFPs for polymers. Surface excitation parameters (SEP) and material parameters (ach) for polymers were determined, using the model of Chen, from comparison of measured and MC calculated elastic peak intensity ratios. These corrections proved to be efficient in decreasing the percentage deviations between the obtained IMFPs and the TPP-2M formula IMFPs. The elastic peak of hydrogen was observed in the EPES spectra of polymers. The experimental contribution of the hydrogen to the total elastic peak was 0.58%, while this value obtained from the MC simulations was 1.98%.
Słowa kluczowe
Wydawca

Czasopismo
Rocznik
Tom
5
Numer
2
Strony
188-200
Opis fizyczny
Daty
wydano
2007-06-01
online
2007-06-01
Twórcy
  • Research Institute for Technical Physics and Materials Sciences HAS, H-1525, Budapest, Hungary
  • Research Institute for Technical Physics and Materials Sciences HAS, H-1525, Budapest, Hungary
  • Research Institute for Technical Physics and Materials Sciences HAS, H-1525, Budapest, Hungary
  • Research Institute for Technical Physics and Materials Sciences HAS, H-1525, Budapest, Hungary
autor
  • Institute of Physical Chemistry PAS, 01-224, Warszawa, Poland, blo@ichf.edu.pl
  • Institute of Physical Chemistry PAS, 01-224, Warszawa, Poland
  • Institute of Physical Chemistry PAS, 01-224, Warszawa, Poland
autor
  • Institute of Nuclear Physics HAS, H-4001, Debrecen, Hungary
autor
  • Institute of Nuclear Physics HAS, H-4001, Debrecen, Hungary
Bibliografia
  • [1] C.J. Powell and A. Jablonski: “Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces”, J. Phys. Chem. Ref. Data, Vol. 28, (1999), pp. 19–62. http://dx.doi.org/10.1063/1.556035[Crossref]
  • [2] B. Lesiak, A. Kosinski, A. Jablonski, L. Kövér, J. Tóth, D. Varga and I. Cserny: “Determination of the inelastic mean free path of electrons in polyaniline samples by elastic peak electron spectroscopy”, Surf. Interface Anal., Vol. 29, (2000), pp. 614–623. http://dx.doi.org/10.1002/1096-9918(200009)29:9<614::AID-SIA907>3.0.CO;2-J[Crossref]
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  • [6] NIST Electron Elastic-Scattering Cross-Section Database, Standard Reference Data Program, SRD 64, National Institute of Standards and Technology, Gaithersburg MD, 1996, v. 1.0.
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  • [24] G. T. Orosz, A. Sulyok, G. Gergely, S. Gurbán and M. Menyhard: “Calculation of the surface excitation parameter for Si and Ge from measured electron backscattered spectra by means of a Monte-Carlo simulation”, Microsc. Microanal., Vol. 9, (2003), pp. 343–348. http://dx.doi.org/10.1017/S1431927603030241[Crossref]
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Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_s11534-007-0012-y
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