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Czasopismo
2008 | 6 | 2 | 293-296
Tytuł artykułu

Fabrication of biaxial textured NiO on Ni in a one-step process

Treść / Zawartość
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
A novel method for the preparation of biaxial textured nickel oxide on commercially available nickel via a modified surface oxidation epitaxy (SOE) process has been developed. Following studies of different heat-treatment procedures for both texturing of nickel and for the fabrication of nickel oxide the following method was found to yield the best results. Nickel was first textured under an argon - hydrogen atmosphere at 1000°C for 120 min, then the temperature was lowered to 800°C and the atmosphere was changed to argon with 3 ppm oxygen. Smooth and crack free c-axis textured and a–b aligned NiO buffer layers with an out-of-plane texture of 7.8° and an in-plane texture of 9.4° were successfully produced. Higher oxygen partial pressure and temperatures resulted in increased surface roughness and excessive grain growth. [...]
Wydawca

Czasopismo
Rocznik
Tom
6
Numer
2
Strony
293-296
Opis fizyczny
Daty
wydano
2008-06-01
online
2008-04-17
Twórcy
  • Institute for Chemical Technology of Inorganic Materials, Johannes Kepler University, A-4040, Linz, Austria, oliver.staller@jku.at
  • Institute for Chemical Technology of Inorganic Materials, Johannes Kepler University, A-4040, Linz, Austria
Bibliografia
  • [1] D.P. Norton et al., Science 274, 755 (1996) http://dx.doi.org/10.1126/science.274.5288.755[Crossref]
  • [2] T.G. Woodcock, J.S. Abell, T.C. Shields, M.G. Hall, Physica C 372–376 (SUPPL. 2), 863 (2002) http://dx.doi.org/10.1016/S0921-4534(02)00874-2[Crossref]
  • [3] T.G. Woodcock, J.S. Abell, M.G Hall, J. Microscopy 205, 231 (2002) http://dx.doi.org/10.1046/j.1365-2818.2002.00991.x[Crossref]
  • [4] T. Watanabe, K. Matsumoto, T. Maeda, T. Tanigawa, I. Hirabayashi, Physica C 357–360 (SUPPL. 1), 914 (2001) http://dx.doi.org/10.1016/S0921-4534(01)00442-7[Crossref]
  • [5] K. Masumoto et al., IEEE Trans. Appl. Supercond. 9, 1539 (1999) http://dx.doi.org/10.1109/77.784687[Crossref]
  • [6] C.F. Liu et al., IEEE Trans. Appl. Supercond. 9, 1471 (1999) http://dx.doi.org/10.1109/77.784670[Crossref]
  • [7] A. Kursumovic et al., Physica C 385, 337 (2003) http://dx.doi.org/10.1016/S0921-4534(02)02016-6[Crossref]
  • [8] R. Hühne et al., J. Phys. D Appl. Phys. 36, 1053 (2003) http://dx.doi.org/10.1088/0022-3727/36/9/301[Crossref]
  • [9] M.J. Graham, M.J. Cohen, Electrochem. Soc. 120, 879 (1972) http://dx.doi.org/10.1149/1.2404360[Crossref]
  • [10] M.J. Graham, R.J. Hussey, M.J. Cohen Electrochem. Soc. 120, 1523 (1973) http://dx.doi.org/10.1149/1.2403296[Crossref]
  • [11] K. Matsumoto et al., Physica C 335, 39 (2000) http://dx.doi.org/10.1016/S0921-4534(00)00139-8[Crossref]
  • [12] Z. Lockman, X. Qi, A. Berenov, R. Nast, W. Goldacker, J. MacManus-Driscoll, Physica C 351 34 (2001) http://dx.doi.org/10.1016/S0921-4534(00)01686-5[Crossref]
  • [13] J. Yang et al., Physica C 412–414, 844 (2004) http://dx.doi.org/10.1016/j.physc.2004.01.109[Crossref]
  • [14] A. Kursumovic, R. Hühne, R. Tomov, B. Holzapfel, B.A. Glowacki, J.E. Evetts, Physica C 405, 219 (2004) http://dx.doi.org/10.1016/j.physc.2004.01.027[Crossref]
  • [15] O. Staller, D. Holzmann, G. Gritzner, P. Diko, D. Mikolaj, F. Kováč, Cent. Eur. J. Chem. (accepted)
  • [16] J.-K. Chung, W.-J. Kim, J. Tal, C.J. Kim, Physica C 463–465, 619 (2007) 296
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_s11532-008-0024-5
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