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Tytuł artykułu

Magnetic properties of cobalt microwires measured by piezoresistive cantilever magnetometry

Treść / Zawartość
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
We present the magnetic characterization of cobalt wires grown by focused electron beam-induced deposition (FEBID) and studied using static piezoresistive cantilever magnetometry. We have used previously developed high force sensitive submicron-thick silicon piezoresistive cantilevers. High quality polycrystalline cobalt microwires have been grown by FEBID onto the free end of the cantilevers using dual beam equipment. In the presence of an external magnetic field, the magnetic cobalt wires become magnetized, which leads to the magnetic field dependent static deflection of the cantilevers. We show that the piezoresistive signal from the cantilevers, corresponding to a maximum force of about 1 nN, can be measured as a function of the applied magnetic field with a good signal to noise ratio at room temperature. The results highlight the flexibility of the FEBID technique for the growth of magnetic structures on specific substrates, in this case piezoresistive cantilevers.
Wydawca

Czasopismo
Rocznik
Tom
1
Numer
1
Opis fizyczny
Daty
otrzymano
2014-05-13
zaakceptowano
2014-07-07
online
2014-09-19
Twórcy
autor
  • Istituto Italiano di Tecnologia (IIT), Center for Bio-Molecular Nanotechnologies, Via Barsanti, 73010 Arnesano, Italy/Instituto de Microelectrónica de Barcelona, IMB-CNM (CSIC), 08193 Bellaterra, Spain
  • Instituto de Ciencia de Materiales de Aragón and Departamento de Física de la Materia Condensada, Universidad de Zaragoza-CSIC, Facultad de Ciencias, 50009 Zaragoza, Spain/ Laboratorio de Microscopías Avanzadas (LMA), Instituto de Nanociencia de Aragón (INA), Universidad de Zaragoza, 50018 Zaragoza, Spain
autor
  • Laboratorio de Microscopías Avanzadas (LMA), Instituto de Nanociencia de Aragón (INA), Universidad de Zaragoza, 50018 Zaragoza, Spain
  • Instituto de Ciencia de Materiales de Aragón and Departamento de Física de la Materia Condensada, Universidad de Zaragoza-CSIC, Facultad de Ciencias, 50009 Zaragoza, Spain/ Laboratorio de Microscopías Avanzadas (LMA), Instituto de Nanociencia de Aragón (INA), Universidad de Zaragoza, 50018 Zaragoza, Spain, deteresa@unizar.es
  • Instituto de Microelectrónica de Barcelona, IMB-CNM (CSIC), 08193 Bellaterra, Spain
autor
  • Instituto de Microelectrónica de Barcelona, IMB-CNM (CSIC), 08193 Bellaterra, Spain
Bibliografia
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Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_nanofab-2014-0008
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