Czasopismo
Tytuł artykułu
Autorzy
Warianty tytułu
Języki publikacji
Abstrakty
The effective signal in x-ray diffraction analysis of material properties often contains high frequency (noise) and low frequency (trend) components as additive parts. It is necessary to extract the effective signal from the noise to ensure high quality of signal processing. Digital filters of Volterra type are proposed for filtering purposes and a comparison of Volterra filtration implemented on x-ray diffraction data versus results from a set of other digital filters is given.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Numer
Strony
440-452
Opis fizyczny
Daty
wydano
2003-09-01
online
2003-09-01
Twórcy
autor
- Military Academy, Demänovská cesta 1, 03119, Liptovský Mikuláš, Slovak Republic
autor
- Military Academy, Demänovská cesta 1, 03119, Liptovský Mikuláš, Slovak Republic
Bibliografia
- [1] M. Meloun and J. Militký: Statistické zpracování exprimentálních dat, PLUS, Praha, 1994.
- [2] L. Smrčok, M. Ďurík, V. Jorík: “Wavelet denoising of powder diffraction patterns”, Powder Diffraction, Vol. 14, (1999), pp. 300–304. [Crossref]
- [3] J. Fiala: “Zpracování mených dat filtrací”, Materials Structure, Vol. 4, (1997), pp. 77–83.
- [4] D. Kocur: Adaptívne Volterrove číslicové filtre. Elfa, Košice, 2001.
- [5] R. Nowak and B. Van Veen: “Efficient methods for identification of Volterra filter models” Signal Processing, Vol. 38, No. 3, (1994), pp. 417–428. http://dx.doi.org/10.1016/0165-1684(94)90157-0[Crossref]
- [6] R. Nowak and B. Van Veen: “Tensor product basis approximations for Volterra filters”, IEEE Trans. Signal Processing, Vol. 44, No. 1, (1996), pp. 36–51. http://dx.doi.org/10.1109/78.482010[Crossref]
- [7] M. Schetzen: The Volterra and Wiener Theories of Nonlinear Systems, Wiley, New York, 1980.
- [8] S., Jurečka, P. Šutta, M. Havlík: “Fourierova a waveletová filtrácia röntgenových difrakčných profilov”, In: Smery vývoja techniky pozemného vojska, Vojenská akadémia Liptovský Mikuláš, November 29–30, 2000, pp. 204–208.
- [9] S. Jurečka and M. Havlík: “Porovnanie aproximačných a Fourierovských dekonvolu cnćh metód pri analýze rtg difrakčných profilov”, Materials Structure, Vol. 8, No. 2, (2001), pp. 83–87.
- [10] J. Nelder and R. Mead: “A simplex method for function minimization”, Computer Journal, Vol. 7, (1965), pp. 308–313 [Crossref]
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_BF02475855