Application of the Volterra filter in experimental diffraction data processing

• Autorzy: Stanislav Jurečka , Mária Jurečková
• Języki publikacji: EN

Abstrakty

EN

The effective signal in x-ray diffraction analysis of material properties often contains high frequency (noise) and low frequency (trend) components as additive parts. It is necessary to extract the effective signal from the noise to ensure high quality of signal processing. Digital filters of Volterra type are proposed for filtering purposes and a comparison of Volterra filtration implemented on x-ray diffraction data versus results from a set of other digital filters is given.

Słowa kluczowe

EN

Volterra filters; x-ray diffraction analysis; 61.10Nz

• Czasopismo: Open Physics
• Rocznik: 2003
• Tom: 1
• Numer: 3
• Strony: 440-452

Daty

wydano

2003-09-01

online

2003-09-01

Twórcy

autor

Stanislav Jurečka

• Military Academy, Demänovská cesta 1, 03119, Liptovský Mikuláš, Slovak Republic

autor

Mária Jurečková

• Military Academy, Demänovská cesta 1, 03119, Liptovský Mikuláš, Slovak Republic

Bibliografia

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• [8] S., Jurečka, P. Šutta, M. Havlík: “Fourierova a waveletová filtrácia röntgenových difrakčných profilov”, In: Smery vývoja techniky pozemného vojska, Vojenská akadémia Liptovský Mikuláš, November 29–30, 2000, pp. 204–208.
• [9] S. Jurečka and M. Havlík: “Porovnanie aproximačných a Fourierovských dekonvolu cnćh metód pri analýze rtg difrakčných profilov”, Materials Structure, Vol. 8, No. 2, (2001), pp. 83–87.
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Identyfikatory

DOI

10.2478/BF02475855