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2004 | 2 | 4 | 645-659
Tytuł artykułu

Multiscale semicontinuous thin film descriptors

Treść / Zawartość
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
In experimental thin film physics, there is a demand to characterize a growing thin film or the thin film resulting from an experiment. While methods for discontinuous, island-like thin films have been developed, there is a lack of results directly applicable to semicontinuous thin film description. In this contribution, a unique combination of image processing methods is collected and further developed, which results in a novel set of semicontinuous thin film descriptors. In particular, the shape of the thin film contours and the thin film image intensity profiles are analyzed in a multiscale manner. The descriptiveness of the proposed features is demonstrated on a few thin film photographs from real experiments. This work establishes a basis for further measurement, description, simulation or other processing in the physics of semicontinuous thin films, using any direct imaging modality.
Wydawca

Czasopismo
Rocznik
Tom
2
Numer
4
Strony
645-659
Opis fizyczny
Daty
wydano
2004-12-01
online
2004-12-01
Twórcy
autor
  • Department of Electronics and Vacuum Physics, Faculty of Mathematics and Physics, Charles University, V Holešovičkách 2, 180 00, Prague 8, Czech Republic, rudolf.hrach@mff.cuni.cz
Bibliografia
  • [1] J. Serra: Image Analysis and Mathematical Morphology, Academic Press, London, 1982.
  • [2] B.D. Ripley: Spatial Statistics, John Wiley and Sons Inc., New York, 1981. http://dx.doi.org/10.1002/0471725218[Crossref]
  • [3] C.L.Y. Yeong, S. Torquato: “Reconstructing random media”, Physical Review E, Vol. 57, (1998), pp. 495–506. http://dx.doi.org/10.1103/PhysRevE.57.495[Crossref]
  • [4] R. Hrach, D. Novotný, S. Novák, J. Pavlík: “Multilevel morphological analysis of continuous films and surfaces”, Thin Solid Films, Vol. 433, (2003), pp. 135–139. http://dx.doi.org/10.1016/S0040-6090(03)00316-X[Crossref]
  • [5] M. Sonka, V. Hlavac and R. Boyle: Image Processing, Understanding, and Machine Vision, 2nd ed., PWS, Boston, 1998.
  • [6] F. Leymarie, M. D. Levine: “Simulating the grassfire transform using an active contour model”, IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 14, (1992), pp. 56–75. http://dx.doi.org/10.1109/34.107013[Crossref]
  • [7] M.I. Khalil, M.M. Bayoumi: “Invariant 2D object recognition using the wavelet modulus maxima”, Pattern Recognition Letters, Vol. 21, (2000), pp. 863–872. http://dx.doi.org/10.1016/S0167-8655(00)00046-5[Crossref]
  • [8] D. Stauffer and A. Aharony: Introduction to Percolation Theory, 2nd ed., Taylor & Francis Ltd., London, 2003.
  • [9] G. Nason and B. Silverman: “The stationary wavelet transform and some statistical applications”, In: Lecture Notes in Statistics: Wavelets and Statistics, Springer Verlag, 1995, pp. 281–300.
  • [10] G. Strang and T. Nguyen: Wavelets and Filter Banks, Wellesley-Cambridge Press, Wellesley, 1996.
  • [11] M. Misiti, Y. Misiti, G. Oppenheim, and J.-M. Poggi: Wavelet Toolbox User’s Guide, The Math Works, Inc., 2002.
  • [12] G. Van de Wouwer, P. Scheunders, D. Van Dyck: “Statistical texture characterization from discrete wavelet representations”, IEEE Transactions on Image Processing, Vol. 8, (1999), pp. 592–598. http://dx.doi.org/10.1109/83.753747[Crossref]
  • [13] W.H. Press, S.A. Teukolsky, W.T. Vetterling, and B.P. Flannery: Numerical Recipes in C: The Art of Scientific Computing, Cambridge University Press, 1992.
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_2478_BF02475567
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