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2006 | 4 | 1 | 194-206
Tytuł artykułu

AFM study of complement system assembly initiated by antigen-antibody complex

Treść / Zawartość
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The shape and size of complement system C1 components assembled on a SiO2 surface after classical activation by antigen-antibody complex was determined by tapping mode atomic force microscopy (AFM). The SiO2 substrate was silanized and bovine leukemia virus proteins gp51 were covalently bound to the SiO2 substrate. Self-assembly of complement system proteins was investigated by AFM. Uniform coating of silanized surface by gp51 proteins was observed by AFM. After incubation of gp51 coated substrate in anti-gp51 antibody containing solution, Ag-Ab complexes were detected on the substrate surface by AFM. Then after treatment of Ag-Ab complex modified substrate by guinea-pig blood serum containing highly active complement system proteins for 3 minutes and 30 minutes features 2–3 times and 5–8 times higher in diameter and in height if compared with those observed after formation of Ag-Ab complex, were observed respectively on the surface of SiO2. This study revealed that AFM might be applied for the imaging of complement system assembly and provides valuable information that can be used to complement other well-established techniques.
Wydawca

Czasopismo
Rocznik
Tom
4
Numer
1
Strony
194-206
Opis fizyczny
Daty
wydano
2006-03-01
online
2006-03-01
Twórcy
  • Research Center for Microsystems and Nanotechnology, Kaunas University of Technology, Studentu 65, 3031, Kaunas, Lithuania
  • Department of Analytical and Environmental Chemistry, Vilnius University, Naugarduko 24, 03225, Vilnius 09, Lithuania
  • Department of Analytical and Environmental Chemistry, Vilnius University, Naugarduko 24, 03225, Vilnius 09, Lithuania
Bibliografia
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Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.-psjd-doi-10_1007_s11532-005-0015-8
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