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Content available local Analysis of errors in on-wafer measurements due to multimode propagation in CB-CPW
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Lewandowski, A. Wiatr, W.
Journal of Telecommunications and Information Technology
2005 nr 2 16-22
EN We study for the first time errors in on-wafer scattering parameter measurements caused by the parasitic microstrip-like mode propagation in conductor-backed coplanar waveguide (CB-CPW). We determine upper bound for these errors for typical CPW devices such as a matched load, an open circuit, and a [...]
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