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1
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Optica Applicata
EN We consider the problem of uncertainty in geometrically linear measurements in scanning probe microscopy (SPM) represented by atomic force microscopy (AFM). The uncertainties under consideration are associated both with quantum phenomena in the space cantilever tip--sample surfaces and with effects [...]
2
80%
Optica Applicata
2011 Vol. 41, nr 2 281--288
EN One of the electrical characterization techniques of semiconductor structures with nanometer spatial resolution is scanning spreading resistance microscopy (SSRM). The applicability of SSRM technique for characterization of GaAs structures with n-type doping fabricated by metalorganic vapour phase e[...]
3
80%
Optica Applicata
EN Electrostatic force microscopy (EFM) is one of important tools for diagnostic of surface electric properties on micro- and nanoscale. Its usefulness can be particularly seen when the development of new devices or materials is considered and its electric behavior is to be investigated. Due to the acc[...]
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Optica Applicata
EN This paper presents the results of research of Cu/Ni multilayers magnetron-deposited on an Si (100) substrate. The thickness of Cu sublayers was identical in all multilayers and equalled 2 nm. The thickness of Ni sublayers varied between 1.2 and 3.0 nm. The surface topography of the multilayers was[...]
5
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Fizykochemiczne Problemy Mineralurgii
1999 Vol. 33 129-141
PL Siły oddziaływań między hydrofobowymi powierzchniami, nazywane hydrofobowymi siłami powierzchniowymi, są istotne w wielu procesach separacji, szczególnie w flotacji gdzie oddziaływania hydrofobowe między hydrofobowym pęcherzykiem powietrza a hydrofobową powierzchnią ziarna mineralnego determinuje ef[...]
EN The interaction forces between hydrophobic surfaces, the so-called hydrophobic surface forces, are important in many areas of particle separation technology, especially, flotation, where the interaction between hydrophobic air bubbles and hydrophobic particle surfaces determine the efficiency of the[...]
6
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Elektronika : konstrukcje, technologie, zastosowania
PL W artykule zaprezentowano nową konstrukcję dźwigni mikroskopu sił atomowych (AFM) wyposażoną w przewodzące, platynowe ostrze pomiarowe. Sekwencja technologiczna wytwarzania przedstawianej sondy integruje wysoką powtarzalność z precyzyjnym postprocessingiem ostrza za pomocą zogniskowanej wiązki jonów[...]
EN In this paper, we present a novel micromachined Atomic Force Microscopy (AFM) micro-cantilever equipped with a sharp, conductive platinum tip. The processing sequence proposed in this article integrates a high reproducibility and precise post processing applying Focused Ion Beam tip modification. Th[...]
7
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Aparatura Badawcza i Dydaktyczna
PL Artykuł opisuje makroskopowy model mikroskopu sił atomowych do zastosowań dydaktycznych oraz zaawansowane doświadczenie studenckie realizowane w II pracowni fizycznej Instytutu Fizyki Doświadczalnej Uniwersytetu Wrocławskiego. Autorzy prezentują stanowisko doświadczalne oraz ilustrują przykładowymi [...]
EN This paper presents a macroscopic model of an atomic force microscope. The tool is designed for an advanced physics experiment to be carried out in Physics Laboratory II at the Institute of Experimental Physics, Wrocław University. The authors discuss the process of setting up the experiment and the[...]
8
80%
Journal of Telecommunications and Information Technology
2001 nr 1 35-39
EN An important element in microelectronics is the comparison of the modelling and measurements results of the real semiconductor devices. Our paper describes the final results of numerical simulation of a micromechanical process sequence of the atomic force microscopy (AFM) sensors. They were obtained[...]
9
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Bulletin of the Polish Academy of Sciences. Technical Sciences
2013 Vol. 61, nr 2 535--539
EN Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-z[...]
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Materials Science Poland
2010 Vol. 28, No. 3 731--740
EN An ultra high vacuum atomic force microscope operating in a noncontact mode has been employed to investigate in situ atomic layer deposition (ALD) of HfO2. Tetrakis-di-methyl-amido-Hf and H2O were used as precursors and the deposition process was performed on Si(001)/SiO2 substrate maintained at 230[...]
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Materials Science Poland
2007 Vol. 25, No. 3 671--678
EN The growth of gadolinia doped ceria films with controlled surface structure for optimum device performance often presents a significant technological problem for experimental investigation. In the present investigation, gadolinium doped ceria (GDC) thin films were prepared by pulsed laser depositio[...]
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Materials Science Poland
2014 Vol. 32, No. 3 391--395
EN Results of the comprehensive morphological study of CdI2–BiI3 layered crystals are presented. Direct AFM observations of micro- and nanostructures formed in the volume of the crystals confirm the predictions made on the basis of positron annihilation spectroscopy studies. The model explaining the po[...]
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Zeszyty Naukowe Politechniki Świętokrzyskiej. Nauki Techniczne
2011 Z. 16 47-55
EN Atomic Force Microscopy (AFM) is from the family of Scanning Probe microscopy common used technique for imaging analysis of material. This paper describe fundamentals of Atomic Force Microscopy - contact, semicontact and noncontact mode. Topography by semicontact mode will be presented by scan image[...]
14
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Bulletin of the Polish Academy of Sciences. Technical Sciences
EN In this paper the implementation of the surface stiffness mapping method with the dynamic measurement mode of atomic force microscopy (AFM) is presented. As the measurement of the higher harmonics of the cantilever’s torsional bending signal is performed, we are able to visualize non-homogeneities o[...]
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Materials Science Poland
EN The paper presents the results of structural examinations and mechanical tests of Cu/Ni multilayers fabricated by the magnetron sputtering method. The investigated multilayers were differentiated by Ni sublayer thickness (1, 3 and 6 nm), while the retaining Cu sublayer thickness was unchanged (2 nm)[...]
16
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Optica Applicata
2013 Vol. 43, nr 1 163--171
EN The investigation of the surface properties changes at micrometer and nanometer scale, due to the presence of various factors such as: temperature, solar radiation or magnetic field, requires suitable diagnostic methods. Atomic force microscopy (AFM) is one of the most popular measurement techniques[...]
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Bulletin of the Polish Academy of Sciences. Technical Sciences
EN Molecular motors are nature's nanomachines and are the essential agents of movement that are an integral part of many living organisms. The supramolecular machine, called the nuclear pore complex (NPC), controls the transport of all cellular material between the cytoplasm and the nucleus that occurs[...]
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Nukleonika
EN We are presenting a study of damage distribution in GaAs irradiated with 84Kr ions of energy EKr = 394 MeV up to the fluence of 5 × 1012 ion/cm-2. The distribution of damage along the projected range of 84Kr ions in GaAs was investigated using selective chemical etching of a single crystal cleaved p[...]
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Zeszyty Naukowe Wydziału Elektrotechniki i Automatyki Politechniki Gdańskiej
2011 Nr 30 17-20
PL W związku z rozwojem nanotechnologii, znacząco wzrosła potrzeba badań mikroskopijnych obiektów. Do takich celów służy mikroskop sił atomowych (AFM), który umożliwia badania topografii próbki oraz dostarcza informacji o jej składzie chemicznym. W ciągu ostatnich dwóch dekad liczba możliwych zastosowa[...]
EN Due to nanotechnology development, there is a strong pressure on research in nanoscale in various environments. An Atomic Force Microscope (AFM) allows to investigate topography of the sample and give some information about it’s chemical composition. During the last two decades, the number of possib[...]
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Elektronika : konstrukcje, technologie, zastosowania
PL Przedstawiono możliwości obserwacji właściwości układów i materiałów mikro- i nanometrowych oraz nanoelektronicznych metodami mikroskopii bliskich oddziaływań. Omówiono podstawowe tryby pomiarowe tej metody badawczej, jej możliwości pomiarowe i zasadnicze ograniczenia. Zaprezentowano również rodzinę[...]
EN In this article we describe the application of Scanning Probe Microscopy (SPM) in high resolution diagnostics of microelectronical devices and materials. In this experimental method the interactions between microtip with the tip radius of 10 nm located above the investigated structure surface are mo[...]
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