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MPS(3N) transparent memory test for Pattern Sensitive Fault detection

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Conventional memory tests based on only one run have constant and low faults coverage especially for Pattern Sensitive Faults (PSF). To increase faults coverage the multiple run March test algorithms have been used. As have been shown earlier the key element of multiple run March test algorithms are memory backgrounds. Only in a case of optimal set of backgrounds the high fault coverage can be achieved. For such optimal backgrounds the analytical calculation of NPSFk fault coverage for 3 and 4 runs of MPS(3N) test in this paper is presented. All of the analytical calculations are confirmed and validated by adequate experiments.
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Bibliogr. 11 poz., rys., tab.
  • Bialystok Technical University, Faculty of Computer Science
  • Bialystok Technical University, Faculty of Computer Science
  • Bialystok Technical University, Faculty of Computer Science
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