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http://yadda.icm.edu.pl:80/baztech/element/bwmeta1.element.baztech-article-BWA0-0006-0051

Czasopismo

Optica Applicata

Tytuł artykułu

Thermoreflectance and micro-Raman measurements of the temperature distributions in broad contact laser diodes

Autorzy Ochalski, T. J.  Piwoński, T.  Wawer, D.  Pierściński, K.  Bugajski, M.  Kozłowska, A.  Maląg, A.  Tomm, J. W. 
Treść / Zawartość http://opticaapplicata.pwr.edu.pl/
Warianty tytułu
Konferencja Surface Physics and Thin-Films Structure Seminar ; 17-21.05.2005 ; Szklarska Poręba, Poland
Języki publikacji EN
Abstrakty
EN In this paper we describe a number of optical techniques suitable for estimation of the semiconductor surface temperature. High spatially resolved thermoreflectance will be shown as a powerful tool to measure temperature distribution at the laser diode front facet. For determination of the absolute value of the front facet temperature we use micro-Raman spectroscopy. Both techniques will be presented as a complementary ways to determine surface temperature distribution on the working laser diode.
Słowa kluczowe
EN thermoreflectance   Raman spectroscopy   semiconductor laser  
Wydawca Oficyna Wydawnicza Politechniki Wrocławskiej
Czasopismo Optica Applicata
Rocznik 2005
Tom Vol. 35, nr 3
Strony 479--484
Opis fizyczny Billiogr. 6 poz., wykr.
Twórcy
autor Ochalski, T. J.
  • Institute of Electron Technology, al. Lotnikow 32/46, 02-668 Warszawa, Poland
autor Piwoński, T.
  • Institute of Electron Technology, al. Lotnikow 32/46, 02-668 Warszawa, Poland
autor Wawer, D.
  • Institute of Electron Technology, al. Lotnikow 32/46, 02-668 Warszawa, Poland
autor Pierściński, K.
  • Institute of Electron Technology, al. Lotnikow 32/46, 02-668 Warszawa, Poland
autor Bugajski, M.
  • Institute of Electron Technology, al. Lotnikow 32/46, 02-668 Warszawa, Poland
autor Kozłowska, A.
  • Institute of Electronic Materials Technology, ul. Wolczynska 133, 01-919 Warszawa, Poland
autor Maląg, A.
  • Institute of Electronic Materials Technology, ul. Wolczynska 133, 01-919 Warszawa, Poland
autor Tomm, J. W.
  • Max Born Institute for Nonlinear Optics and Short Pulse Spectrocopy, Max-Born 2A, D 12489 Berlin, Germany
Bibliografia
[1] Epperlein P.W., Bona G.L., Roentgen P., Local mirror temperatures of red-emitting (Al)GaInP quantum-well laser diodes by Raman scattering and reHectance modulation measurements, Applied Physics Letters 60(6), 1992, pp. 680-2.
[2] Todoroki S., Sawai M., Aiki K., Temperature distribution along the striped active region in high-power GaA^lA^s visible lasers, Journal of Applied Physics 58(3), 1985, pp. 1124-8.
[3] Brugger H., Epperlein P.W., Mapping of local temperatures on mirrors of GaAs/AlGaAs laser diodes, Applied Physics Letters 56(11), 1990, pp. 1049-51.
[4] Shvydka D., Rakotoniaina J.P., Breitenstein O., Lock-in thermography and nonuniformity modeling of thin-f^ilm CdT^e solar cells, Applied Physics Letters 84(5), 2004, pp. 729-31.
[5] Albright G.C., Stump J.A., McDonald J.D., Kaplan H., True temperature measurements on microscopic semiconductor targets, Proceedings of the SPIE 3700, 1999, pp. 245-50.
[6] Albright G.C., Stump J.A., Li C.P., Kaplan H., Emissivity-corrected infrared thermal pulse measurementon microscopic semiconductor targets, Proceedings of the SPIE 4360, 2001, pp. 103-11.
Kolekcja BazTech
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