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Metrology and Measurement Systems

Tytuł artykułu

Distribution of roughness and waviness components of turned surface profiles

Autorzy Boryczko, A. 
Treść / Zawartość
Warianty tytułu
Języki publikacji EN
EN The paper presents a spectral formulation of surface profile irregularity in a wideband frequency range for roughness, waviness and shape components along the measured length. A unique distribution of roughness and waviness components is proposed, according to the nature of their origination in the course of machining with tools of defined cutting edge, as distinct from standard filtration in measurements of surface irregularities. Differences resulting from both formulations are outlined as well as the method of determining the frequency of component separation for surface roughness and waviness.
Słowa kluczowe
EN surface irregularity   roughness   waviness   spectral analysis of surface irregularities  
Wydawca Komitet Metrologii i Aparatury Naukowej PAN
Czasopismo Metrology and Measurement Systems
Rocznik 2010
Tom Vol. 17, nr 4
Strony 611--620
Opis fizyczny Bibliogr. 12 poz., rys., tab., wykr.
autor Boryczko, A.
  • Gdansk University of Technology, Faculty of Mechanical Engineering, Narutowicza 11/12, 80-233 Gdansk, Poland,
[1] Raja, J., Muralikrishnan, B., Shengyu, F. (2002). Recent advances in separation of roughness, waviness and form. Precision Engineering, 26, 222-235.
[2] Boryczko, A. (2003) A method of frequency-domain analysis of irregularities of turned surfaces in diagnosing a machining systems. Monografie 42, Gdansk: Publishing house of Gdansk University of Technology. (in Polish)
[3] Adamczak, S. (2006). Measurement of surface texture and assessment of surface geometric form. Measurement principles and conditions requirements. Standarization to surface measurements. Mechanik, 3, 180-183. (in Polish).
[4] EN ISO 11562:1996 Geometrical Product Specification (GPS) - Surface texture: Profile metod - Metrological characteristics of phase correct filters.
[5] Sidki H. M., Amer M. (2008). Evaluation of CMM for flatness measurements, Metrol. Meas. Syst., 15(4), 558-593.
[6] Bendat, J.S., Piersol, A.G. (1971). Random data: Analysis and Measurement Procedures. New York: John Wiley & Sons, Inc.
[7] Boryczko. A. (2002). Conditions for measurement, analog-to-digital conversion and frequency analysis of irregularities of profile surface. Metrol. Meas. Syst., 10(2), 157-167.
[8] Boryczko, A. (2010). Cylindrical surface irregularities presented by frequency spectra of relative tool displacement to the workpiece. Measurement, 43, 586-595.
[9] Lingadurai, K., Shunmugam, M.S. (2006). Metrological characteristic of wavelet filter used for engineering surfaces. Measurement, 39, 575-584.
[10] Bigerelle, M., Gautier, A., Hagege, B., Favergeon, J., Bounichane, B. (2009). Roughness characteristic length scales of belt finished surface. Journal of Materials Processing Technology, 209, 6103-6116.
[11] Clarysse, F., Vermeulen, M. (2004). Characterizing the surface waviness of steel sheet: reducing the assessment length by robust filtering. Wear, 257, 1219-1225.
[12] Poniatowska M. (2009). Research on spatial interrelations of geometric deviations determined in coordinate measurements of free-form surfaces. Metrol. Meas. Syst., 16(3), 501-510.
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