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Digital holography in flatness and crack investigation

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Języki publikacji
Digital holography (DH) which is the technology of acquiring and processing measurement data via a CCD camera is spreading to industrial applications, finds wide employment in engineering problems of testing and investigation. In this paper, a simple digital holographic system, comprising a He-Ne laser source, CCD camera and analyzing software, is used for testing surface flatness and detecting the presence of a propagating crack on the surface plane and the effect of the crack on the neighborhood. Phase variations across the surfaces planes are extracted to represent the surface deviation from a reference plane. The analysis methods differ according to the interference fringes in the recorded holograms. Both fringe tracking and Fourier transform with phase unwrapping methods are used in the interpretation of interferometric fringe patterns.
Opis fizyczny
Bibliogr. 8 poz., rys.
  • National Institute for Standards, Optical Metrology Department, Tersa st., Haram, P.O.B 136, 12211, Giza, Egypt,
  • [1] Rober, K., Erf. (1974). Holographic non destructive testing. New York: Academic Press Inc.
  • [2] Schnars, U., Juptner, W. (1994). Direct recording of holograms by a CCD target and numerical reconstruction. Applied optics, 33(2), 179-181.
  • [3] Kreis, T. (2005). Handbook of holographic interferometry: optical and digital methods. Wiley.
  • [4] Takeda, M., Ina, H., Kobayashi, S. (1982). Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry. J. Opt. Soc. Am., (72), 156-160.
  • [5] Takeda, M. (1990). Spatial-carrier fringe-pattern analysis and its applications to precision interferometry and profilometry. Ind. Metrol., 1, 79-99.
  • [6] Kujawińska, M. (1993). Spatial phase measurement methods. Robinson, D.W., Reid, G.T. (eds). Interferogram analysis: digital fringe patterns measurement techniques. Bristol: IOP, 141-193.
  • [7] Malacara, D., Devore, S.L. (1992). Interferogram evaluation and wavefront fitting. Malacara, D. (ed.). Optical shop testing. 2nd ed. New York: John Wiley, 455-499.
  • [8] Malacara, D., Servin, M., Malacara, Z. (1998). Interferogram analysis for optical testing. New York: Marcel Dekker.
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