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http://yadda.icm.edu.pl:80/baztech/element/bwmeta1.element.baztech-article-BSW1-0062-0005

Czasopismo

Metrology and Measurement Systems

Tytuł artykułu

Fault diagnosis in analog electronic circuits - the SVM approach

Autorzy Grzechca, D.  Rutkowski, J. 
Treść / Zawartość http://www.metrology.pg.gda.pl/archives.html http://journals.pan.pl/dlibra/journal/99851
Warianty tytułu
Języki publikacji EN
Abstrakty
EN In this paper, the application of the SVM (Support Vector Machine) algorithm has been used for diagnosis and tests of analog electronic circuits. The diagnosis procedure belongs to simulation-before-test techniques, where simulations of the circuit under test (CUT) are performed at the before-test stage. Two examples have been verified for parametric and catastrophic faults in the time domain, but the conclusion is driven with the use of assumed features. A fault-driven test (FDT) has been applied to a filter circuit and a specification-driven test (SDT) to a field-programmable analog array (FPAA). The SVM classifies features which are calculated from the time domain responses. Results obtained from the examples prove a high detection and localization level of circuit states with the use of the SVM classifier.
Słowa kluczowe
EN fault diagnosis   electronic circuits   support vector machine (SVM)  
Wydawca Komitet Metrologii i Aparatury Naukowej PAN
Czasopismo Metrology and Measurement Systems
Rocznik 2009
Tom Vol. 16, nr 4
Strony 583--597
Opis fizyczny Bibliogr. 29 poz., rys., tab., wykr.
Twórcy
autor Grzechca, D.
autor Rutkowski, J.
  • Silesian University of Technology, Institute of Electronics, Division of Circuit and Signal Theory, Akademicka 16, 44-100 Gliwice, Poland, Damian.Grzechca@polsl.pl
Bibliografia
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