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http://yadda.icm.edu.pl:80/baztech/element/bwmeta1.element.baztech-article-BSW1-0062-0002

Czasopismo

Metrology and Measurement Systems

Tytuł artykułu

Study of the random noise test of analog-to-digital converters

Autorzy Correa Alegria, F. 
Treść / Zawartość http://www.metrology.pg.gda.pl/archives.html http://journals.pan.pl/dlibra/journal/99851
Warianty tytułu
Języki publikacji EN
Abstrakty
EN An exact expression for the expected value of the mean square difference of the two data sets acquired during the IEEE 1057 Standard Random Noise Test of analog to digital converters is derived. This expression can be used to estimate exactly the amount of random noise present which is an improvement over the heuristically derived estimator suggested in the standard. A study of the influence of stimulus signal amplitude and offset on the existing estimator is carried out.
Słowa kluczowe
EN analog-to-digital converter   IEEE 1057   random noise   estimation  
Wydawca Komitet Metrologii i Aparatury Naukowej PAN
Czasopismo Metrology and Measurement Systems
Rocznik 2009
Tom Vol. 16, nr 4
Strony 545--556
Opis fizyczny Bibliogr. 14 poz., rys., wykr., wzory
Twórcy
autor Correa Alegria, F.
  • Instituto de Telecomunicaçoes e Instituto Superior Técnico, Av. Rovisco Pais, 1, 1049-001 Lisbon, Portugal, falegria@lx.it.pt
Bibliografia
[1] R.C. Martins, A. Cruz Serra: “ADC Characterization by using the Histogram Test stimulated by Gaussian Noise. Theory and experimental results”. Measurement, vol. 27, no. 4, June, 2000, pp. 291-300.
[2] R.C. Martins, A. Cruz Serra: “Automated ADC characterization using the histogram test stimulated by Gaussian noise”. IEEE Trans. on Instr. and Measurement, vol. 48, no. 2, April, 1999, pp. 471-474.
[3] J. Dias Pereira, P. Silva Girão, A. Cruz Serra: “Dithering Performance of Oversampled ADC Systems Affected by Hysteresis”. Measurement, vol. 32, no. 1, June, 2002, pp. 51-59.
[4] F. Corrêa Alegria, A. Cruz Serra: “Influence of Frequency Errors in the Variance of the Cumulative Histogram”. IEEE Tran. on Instr. and Measurements, vol. 50, no. 2, April 2001, pp. 461-464.
[5] F. Corrêa Alegria, A. Cruz Serra: “Error in the Estimation of Transition Voltages with the Standard Histogram Test of ADCs”. Measurement, Elsevier Science, vol. 35, no. 4, June 2004, pp. 389-397.
[6] F. Corrêa Alegria, P. Arpaia, A. Cruz Serra, P. Daponte: “Performance Analysis of an ADC Histogram Test Using Small Triangular Waves” IEEE Trans. on Instr. and Meas., vol. 51, no. 4, August 2002, pp. 723-729.
[7] S. Shariat-Panahi, F. Corrêa Alegria, A. Manuel, A. Cruz Serra: “IEEE 1057 Jitter Test of Waveform Recorders”. Trans. on Instr. and Measurement, vol. 58, no. 7, July, 2009, pp. 2234-2244.
[8] F. Corrêa Alegria: “Bias of Amplitude Estimation Using Three-Parameter Sine Fitting in the Presence of Additive Noise”. Measurement, Elsevier Science, vol. 42, no. 5, June 2009, pp. 748-756.
[9] F. Corrêa Alegria: “Precision of Harmonic Amplitude Estimation on Jitter Corrupted Data”. Submitted to Measurement, 2009.
[10] IEEE Standard for digitizing waveform recorders. IEEE Std. 1057-2007, Institute of Electrical and Electronics Engineers, Inc., April 2008.
[11] IEEE Standard for terminology and test methods for analog-to-digital converters. IEEE Std. 1241, 2000.
[12] F. Corrêa Alegria, A. Cruz Serra: “Uncertainty of ADC Random Noise Estimates Obtained with the IEEE 1057 Standard Test”. IEEE Transactions on Instrumentation and Measurement, vol. 54. no. 1, Feb. 2005, pp. 110-116.
[13] B. Widrow, I. Kollár: Quantization Noise: Roundoff Error In Digital Computation, Signal Processing, Control, And Communications. Cambridge University Press, 2008.
[14] A. Papoulis: Probability, Random Variables and Stochastic Processes. McGraw-Hill, 3rd ed., 1991.
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