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Journal of Telecommunications and Information Technology

Tytuł artykułu

Analysis of errors in on-wafer measurements due to multimode propagation in CB-CPW

Autorzy Lewandowski, A.  Wiatr, W. 
Treść / Zawartość
Warianty tytułu
Języki publikacji EN
EN We study for the first time errors in on-wafer scattering parameter measurements caused by the parasitic microstrip-like mode propagation in conductor-backed coplanar waveguide (CB-CPW). We determine upper bound for these errors for typical CPW devices such as a matched load, an open circuit, and a transmission line section. To this end, we develop an electromagnetic-simulations-based multimode three-port model for the transition between an air-coplanar probe and the CB-CPW. Subsequently, we apply this model to examine errors in the device S parameters de-embedded from measurements affected by the parasitic MSL mode. Our analysis demonstrates that the multimode propagation in CB-CPW may significantly deteriorate the S-parameters measured on wafer.
Słowa kluczowe
EN on-wafer measurements   multimode propagation   error analysis   conductor-backed coplanar waveguide (CB-CPW)   microstrip-like mode   numerical electromagnetic analysis   on-wafer probe   calibration   de-embedding   monolithic microwave integrated circuit (MMIC)  
Wydawca Instytut Łączności - Państwowy Instytut Badawczy
Czasopismo Journal of Telecommunications and Information Technology
Rocznik 2005
Tom nr 2
Strony 16--22
Opis fizyczny Bibliogr. 15 poz., rys.
autor Lewandowski, A.
autor Wiatr, W.
  • Institute of Electronic System, Warsaw University of Technology, Nowowiejska st 15/19, 00-661 Warsaw, Poland,
Kolekcja BazTech
Identyfikator YADDA bwmeta1.element.baztech-article-BAT3-0024-0022