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http://yadda.icm.edu.pl:80/baztech/element/bwmeta1.element.baztech-article-BAT3-0022-0020

Czasopismo

Journal of Telecommunications and Information Technology

Tytuł artykułu

Semi-automatic test system for characterization of ASIC/MPWS

Autorzy Zając, J.  Wójcik, J.  Kociubiński, A.  Tomaszewski, D. 
Treść / Zawartość
Warianty tytułu
Języki publikacji EN
Abstrakty
EN A measurement system for integrated circuit testing has been developed. It consists of a semi-automatic probe station and a set of measurement equipment controlled by commercially available measurement software. The probe station is controlled by dedicated software. Both the measurement and station-control software communicate using the DDE protocol. The measurement system is flexible. It is particularly suitable for semi-automatic testing of multi-project wafers. Output data generated by the system is used for the characterization of the CMOS technologies.
Słowa kluczowe
EN automatic testing   diagnostics of technology   multi-project wafers  
Wydawca Instytut Łączności - Państwowy Instytut Badawczy
Czasopismo Journal of Telecommunications and Information Technology
Rocznik 2005
Tom nr 1
Strony 124--128
Opis fizyczny Bibliogr. 6 poz., il.
Twórcy
autor Zając, J.
  • Industrial Institute of Electronics, Długa st 44/50, 00-241 Warsaw, Poland, jzajac@pie.edu.pl
autor Wójcik, J.
autor Kociubiński, A.
  • Institute of Electron Technology Lotników av. 32/46 02-668 Warsaw, Poland, akociub@wp.pl
autor Tomaszewski, D.
  • Institute of Electron Technology Lotników av. 32/46 02-668 Warsaw, Poland, tomasz@ite.waw.pl
Bibliografia
[1] H. Rodent, "Supportingin the clipboard, ODE and OLE in applications", MSDN Library Visual Studio 6.0, 1992.
[2] H. Rodent, "Quick and easy DDE server", MSDN Library Visual Studio 6.0, 1992.
[3] "METRICS documentation", http://www.metricstech.com
[4] J. Marczewski et al., "Monolithic silicon pixel detectors in SOI technology", in Linear Coll. Worksh., Prague, Czech Republic, 2002, http://www-hep2.fzu.cz/ecfadesy/Talks/Vertex Detector/Marczewski Jacek Prague ECFA DESY.pps
[5] M. Barański et al., "TSSOI as an effcient tool for diagnostics of SOI technology in the IET", in 6th Symp. Diagn.&Yield, Warsaw, Poland, 2003.
[6] D. Tomaszewski et al., "A versatile tool for MOSFETs parameters extraction", in 6th Symp. Diagn.&Yield, Warsaw, Poland, 2003.
Kolekcja BazTech
Identyfikator YADDA bwmeta1.element.baztech-article-BAT3-0022-0020
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