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http://yadda.icm.edu.pl:80/baztech/element/bwmeta1.element.baztech-0235f323-9362-47aa-8305-3623779139fe

Czasopismo

Materials Science Poland

Tytuł artykułu

Studies on structural, optical and electrical properties of electron beam evaporated Cu2SnSe3 thin films

Autorzy Helan, P. P. J.  Mohanraj, K.  Sivakumar, G. 
Treść / Zawartość http://www.materialsscience.pwr.wroc.pl/
Warianty tytułu
Języki publikacji EN
Abstrakty
EN The present work describes the deposition of semiconducting Cu2SnSe3thin films by electron beam evaporation method. The structure of the deposited films was characterized by XRD and Raman analysis. X-ray diffraction study revealed that the Cu2SnSe3thin films had a cubic sphalerite-like structure with crystallite size of 12 nm. Raman spectrum of the thin films confirmed the phase purity. FESEM analysis showed a continuous film with polydispersed grains of a diameter less than 1 цш and the elemental composition was confirmed by EDS spectrum. The UV-Vis spectrum revealed that the sample had high absorption in the visible region and the band gap was found to be 1.15 eV. The I-V graph exhibited the electrical resistivity and conductivity of the film as 2.13 Ω-cm and 0.468 S/cm, respectively. Thus, the electron beam evaporated Cu2SnSe3thin films showed high purity of structure and good morphological, optical and electrical properties comparable with other methods of thin film deposition.
Słowa kluczowe
EN Cu2SnSe3   thin films   electron beam   evaporation method   purity   phase structure  
Wydawca Springer
Czasopismo Materials Science Poland
Rocznik 2016
Tom Vol. 34, No. 4
Strony 703--707
Opis fizyczny Bibliogr. 12 poz., rys.
Twórcy
autor Helan, P. P. J.
  • Department of Physics, Manonmaniam Sundaranar University, Tirunelveli, Tamil Nadu, India
autor Mohanraj, K.
autor Sivakumar, G.
  • CISL, Department of Physics, Annamalai University, Annamalai Nagar, Tamil Nadu, India
Bibliografia
[1] HEMA CHANDRA G., LAKSHMANA KUMAR O., PRASADA RAO R., UTHANNA S., J. Mater. Sci., 46 (2011), 6952.
[2] SURESH BABU G., KISHORE KUMAR Y.B., BHARATH KUMAR REDDY Y., SUNDARA RAJA V., Mater. Chem. Phys., 96 (2006), 442.
[3] SONG J.M. et al., J. Alloys Compd., 581 (2013), 646.
[4] UDAY BHASKAR P., SURESH BABU G., KISHORE KUMAR Y. B., SUNDARA RAJA V., Appl. Surf. Sci., 257 (2011), 8529.
[5] IBANEZ M., CADAVID D. et al., J. Mater. Chem. A, 1 (2013), 1421.
[6] KIM K.M., TAMPO H., SHIBATA H., NIKI S., Thin Solid Films, 536 (2013), 111.
[7] HAMDANI K. et al., Opt. Mater., 37 (2014), 338.
[8] KUO D.-K., HAUNG W.-D., HUANG Y.-S., WU J.-D., LIN Y.-J., Thin Solid Films, 518 (2010), 7218.
[9] LEE P.-Y., SHEI S.-C, HSU E.-H., CHANG S.-J., Mater. Lett., 102 (2013), 120.
[10] HENRY J., MOHANRAJ K., KANNAN S., BARATHAN S., SIVAKUMAR G., J. Optoelect. Adv. Mater., 15 (2013), 1047.
[11] ZHU L., QIANG Y.-H., ZHAO Y.-L., GU X.-Q., SONG D.-M., SONG C.-B., Acta phys. Chem. Sin., 11 (2013), 2339.
[12] ZULKARNAIN Z., ANUAR K., MOHD Z.H., CHUAH H.C., Mater. Lett., 58 (2004), 2199.
Uwagi
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).
Kolekcja BazTech
Identyfikator YADDA bwmeta1.element.baztech-0235f323-9362-47aa-8305-3623779139fe
Identyfikatory
DOI 10.1515/msp-2016-0106